Hongshin Jun

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Removing scan channel limitation on semiconductor devices
- Patent number 8,935,583
- Issue date Jan 13, 2015
- Cisco Technology, Inc.
- Hongshin Jun
- G01 - MEASURING TESTING
Information Patent Grant
JTAG to system bus interface for accessing embedded analysis instru...
- Patent number 7,543,208
- Issue date Jun 2, 2009
- Cisco Technology, Inc.
- Hongshin Jun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Programmable test pattern and capture mechanism for boundary scan
- Patent number 7,089,470
- Issue date Aug 8, 2006
- Cisco Technology, Inc.
- Sang Hyeon Baeg
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Removing Scan Channel Limitation on Semiconductor Devices
- Publication number 20130318410
- Publication date Nov 28, 2013
- Cisco Technology, Inc.
- Hongshin Jun
- G01 - MEASURING TESTING
Information Patent Application
JTAG to system bus interface for accessing embedded analysis instru...
- Publication number 20080052582
- Publication date Feb 28, 2008
- Cisco Technology, Inc., A CALIFORNIA CORPORATION
- Hongshin Jun
- G06 - COMPUTING CALCULATING COUNTING