Hongwei Gao

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Data optimization method and integral prestack depth migration method
- Patent number 11,209,563
- Issue date Dec 28, 2021
- INSTITUTE OF GEOLOGY AND GEOPHYSICS
- Linong Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuitry and method for testing the same, test system
- Patent number 11,099,226
- Issue date Aug 24, 2021
- BOE Technology Group Co., Ltd.
- Hongwei Gao
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for aging process on transistors in a display panel
- Patent number 11,018,167
- Issue date May 25, 2021
- BOE Technology Group Co., Ltd.
- Ke Zhao
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Test circuit, display substrate, test method thereof and display ap...
- Patent number 10,902,760
- Issue date Jan 26, 2021
- BOE Technology Group Co., Ltd.
- Xiaowei Wang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Capacitor detection method and pixel driving circuit
- Patent number 10,621,920
- Issue date Apr 14, 2020
- BOE Technology Group Co., Ltd.
- Hongwei Gao
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Circuit board and method for manufacturing the same, terminal test...
- Patent number 10,412,826
- Issue date Sep 10, 2019
- BOE Technology Group Co., Ltd.
- Pucha Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test circuit, test method, display panel and display apparatus
- Patent number 10,229,619
- Issue date Mar 12, 2019
- BOE Technology Group Co., Ltd.
- Yuebai Han
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Data Optimization Method and Integral Prestack Depth Migration Method
- Publication number 20200363549
- Publication date Nov 19, 2020
- Institute of Geology and Geophysics, Chinese Academy of Sciences
- Linong Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST CIRCUITRY AND METHOD FOR TESTING THE SAME, TEST SYSTEM
- Publication number 20190302172
- Publication date Oct 3, 2019
- BOE TECHNOLOGY GROUP CO., LTD.
- Hongwei Gao
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT, DISPLAY SUBSTRATE, TEST METHOD THEREOF AND DISPLAY AP...
- Publication number 20190236993
- Publication date Aug 1, 2019
- BOE TECHNOLOGY GROUP CO., LTD.
- Xiaowei WANG
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
CAPACITOR DETECTION METHOD AND PIXEL DRIVING CIRCUIT
- Publication number 20190237019
- Publication date Aug 1, 2019
- BOE TECHNOLOGY GROUP CO., LTD.
- Hongwei Gao
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
METHOD AND SYSTEM FOR AGING PROCESS ON TRANSISTORS IN A DISPLAY PANEL
- Publication number 20190189651
- Publication date Jun 20, 2019
- BOE TECHNOLOGY GROUP CO., LTD.
- Ke ZHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT BOARD AND METHOD FOR MANUFACTURING THE SAME, TERMINAL TEST...
- Publication number 20190075650
- Publication date Mar 7, 2019
- BOE TECHNOLOGY GROUP CO., LTD.
- Pucha ZHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST CIRCUIT, TEST METHOD, DISPLAY PANEL AND DISPLAY APPARATUS
- Publication number 20170200404
- Publication date Jul 13, 2017
- BOE TECHNOLOGY GROUP CO., LTD.
- Yuebai Han
- H01 - BASIC ELECTRIC ELEMENTS

Hongwei Gao

Person

Patents Grantslast 30 patents

Data optimization method and integral prestack depth migration method

Test circuitry and method for testing the same, test system

Method and system for aging process on transistors in a display panel

Test circuit, display substrate, test method thereof and display ap...

Capacitor detection method and pixel driving circuit

Circuit board and method for manufacturing the same, terminal test...

Test circuit, test method, display panel and display apparatus

Patents Applicationslast 30 patents

Data Optimization Method and Integral Prestack Depth Migration Method

TEST CIRCUITRY AND METHOD FOR TESTING THE SAME, TEST SYSTEM

TEST CIRCUIT, DISPLAY SUBSTRATE, TEST METHOD THEREOF AND DISPLAY AP...

CAPACITOR DETECTION METHOD AND PIXEL DRIVING CIRCUIT

METHOD AND SYSTEM FOR AGING PROCESS ON TRANSISTORS IN A DISPLAY PANEL

CIRCUIT BOARD AND METHOD FOR MANUFACTURING THE SAME, TERMINAL TEST...

TEST CIRCUIT, TEST METHOD, DISPLAY PANEL AND DISPLAY APPARATUS