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Hormuzdiar E. Nariman
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Austin, TX, US
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last 30 patents
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Patent Grant
Selective P-channel VT adjustment in SiGe system for leakage optimi...
Patent number
7,253,045
Issue date
Aug 7, 2007
Advanced Micro Devices, Inc.
Derick J. Wristers
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Linewidth measurement structure with embedded scatterometry structure
Patent number
6,822,260
Issue date
Nov 23, 2004
Advanced Micro Devices, Inc.
Hormuzdiar E. Nariman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Polysilicon linewidth measurement structure with embedded transistor
Patent number
6,812,506
Issue date
Nov 2, 2004
Advanced Micro Devices, Inc.
Hormuzdiar E. Nariman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ring oscillator with embedded scatterometry grate array
Patent number
6,801,096
Issue date
Oct 5, 2004
Advanced Micro Devices, Inc.
Hormuzdiar E. Nariman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of using high yielding spectra scatterometry measurements to...
Patent number
6,785,009
Issue date
Aug 31, 2004
Advanced Micro Devices, Inc.
James Broc Stirton
G01 - MEASURING TESTING