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Horng-Bin Wang
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Hsinchu City, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Probe head and conductive probe thereof
Patent number
11,300,586
Issue date
Apr 12, 2022
Premtek International Inc.
YaJu Huang
G01 - MEASURING TESTING
Information
Patent Grant
Probe head and conductive probe thereof
Patent number
11,125,778
Issue date
Sep 21, 2021
Premtek International Inc.
Ya-Ju Huang
G01 - MEASURING TESTING
Information
Patent Grant
Unified protocol device with self functional test and associated me...
Patent number
10,084,683
Issue date
Sep 25, 2018
Mediatek Inc.
Hsuan-Jung Hsu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Integrated compound nano probe card and method of making same
Patent number
7,671,612
Issue date
Mar 2, 2010
Industrial Technology Research Institute
Horng-Jee Wang
G01 - MEASURING TESTING
Information
Patent Grant
Integrated compound nano probe card
Patent number
7,652,492
Issue date
Jan 26, 2010
Industrial Technology Research Institute
Horng-Jee Wang
G01 - MEASURING TESTING
Information
Patent Grant
Integrated probe module for LCD panel light inspection
Patent number
7,619,429
Issue date
Nov 17, 2009
Industrial Technology Research Institute
Min-Chieh Chou
G01 - MEASURING TESTING
Information
Patent Grant
Integrated compound nano probe card and method of making same
Patent number
7,585,548
Issue date
Sep 8, 2009
Industrial Technology Research Institute
Horng-Jee Wang
G01 - MEASURING TESTING
Information
Patent Grant
Integrated complex nano probe card and method of making same
Patent number
7,400,159
Issue date
Jul 15, 2008
Industrial Technology Research Institute
Horng-Jee Wang
G01 - MEASURING TESTING
Information
Patent Grant
Integrated type probe card and its fabrication method
Patent number
7,057,406
Issue date
Jun 6, 2006
Industrial Technology Research Institute
Jyh-Chun Chang
G01 - MEASURING TESTING
Information
Patent Grant
High conducting thin-film nanoprobe card and its fabrication method
Patent number
7,012,441
Issue date
Mar 14, 2006
Industrial Technology Research Institute
Min-Chieh Chou
G01 - MEASURING TESTING
Information
Patent Grant
In-cell air management
Patent number
6,500,575
Issue date
Dec 31, 2002
Industrial Technology Research Institute
Lih-Ren Shiue
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Linear actuator
Patent number
6,104,125
Issue date
Aug 15, 2000
Industrial Technology Research Institute
Jia-Tian Pan
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Micro-positioned flatbed
Patent number
6,075,311
Issue date
Jun 13, 2000
Industrial Technology Research Institute
Jia-Tian Pan
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Patents Applications
last 30 patents
Information
Patent Application
PROBE HEAD AND CONDUCTIVE PROBE THEREOF
Publication number
20210003611
Publication date
Jan 7, 2021
Premtek International Inc.
YaJu Huang
G01 - MEASURING TESTING
Information
Patent Application
UNIFIED PROTOCOL DEVICE WITH SELF FUNCTIONAL TEST AND ASSOCIATED ME...
Publication number
20180115480
Publication date
Apr 26, 2018
MEDIATEK INC.
Hsuan-Jung Hsu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method of Reducing Mutual Interference between Universal Serial Bus...
Publication number
20180103127
Publication date
Apr 12, 2018
MEDIATEK INC.
Cheok Yan Goh
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
WIRELESS COMMUNICATIONS SYSTEM PERFORMING TRANSMISSION AND RECEPTIO...
Publication number
20140241406
Publication date
Aug 28, 2014
MEDIATEK INC.
Ching-Hwa Yu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method of Reducing Mutual Interference between Universal Serial Bus...
Publication number
20140244852
Publication date
Aug 28, 2014
RALINK TECHNOLOGY CORP.
Cheok Yan Goh
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
BLADE TYPE MICRO PROBE AND METHOD OF MANUFACTURING THE SAME
Publication number
20140091822
Publication date
Apr 3, 2014
Horng-Jee Wang
G01 - MEASURING TESTING
Information
Patent Application
Integrated compound nano probe card and method of making same
Publication number
20090121734
Publication date
May 14, 2009
Industrial Technology Research Institute
Horng-Jee Wang
G01 - MEASURING TESTING
Information
Patent Application
Integrated compound nano probe card and method of making same
Publication number
20090002004
Publication date
Jan 1, 2009
Industrial Technology Research Institute
Horng-Jee Wang
G01 - MEASURING TESTING
Information
Patent Application
Integrated compound nano probe card and method of making same
Publication number
20080160195
Publication date
Jul 3, 2008
Industrial Technology Research Institute
Horng-Jee Wang
G01 - MEASURING TESTING
Information
Patent Application
Integrated type probe card and its fabrication method
Publication number
20050174132
Publication date
Aug 11, 2005
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Jyh-Chun Chang
G01 - MEASURING TESTING
Information
Patent Application
Integrated probe module for LCD panel light inspection
Publication number
20050083074
Publication date
Apr 21, 2005
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Min-Chieh Chou
G01 - MEASURING TESTING
Information
Patent Application
High conducting thin-film nanoprobe card and its fabrication method
Publication number
20040211589
Publication date
Oct 28, 2004
Industrial Technology Research Institute
Min-Chieh Chou
G01 - MEASURING TESTING
Information
Patent Application
Integrated compound nano probe card and method of making same
Publication number
20040106218
Publication date
Jun 3, 2004
Industrial Technology Research Institute
Horng-Jee Wang
G01 - MEASURING TESTING
Information
Patent Application
Near-field optical flying head
Publication number
20030067860
Publication date
Apr 10, 2003
Industrial Technology Research Institute
Shih-Che Lo
G11 - INFORMATION STORAGE
Information
Patent Application
Near field optical disk
Publication number
20020168586
Publication date
Nov 14, 2002
Shih-Che Lo
B82 - NANO-TECHNOLOGY