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Horng-Chuan Sun

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  • Jhu-dong Township, TW
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Patents Grantslast 30 patents

  • Information Patent Grant

    Vertical probe head
    • Patent number 11,774,468
    • Issue date Oct 3, 2023
    • MPI Corporation
    • Chin-Tien Yang
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spring probe and probe card having spring probe
    • Patent number 10,393,773
    • Issue date Aug 27, 2019
    • MPI Corporation
    • Tsung-Yi Chen
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probing device
    • Patent number 7,782,070
    • Issue date Aug 24, 2010
    • MJC Probe Incorporated
    • Wei-Cheng Ku
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Multi-function probe card
    • Patent number 6,984,998
    • Issue date Jan 10, 2006
    • MJC Probe Inc.
    • Horng-Chuan Sun
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    VERTICAL PROBE HEAD
    • Publication number 20230007997
    • Publication date Jan 12, 2023
    • MPI Corporation
    • CHIN-TIEN YANG
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPRING PROBE AND PROBE CARD HAVING SPRING PROBE
    • Publication number 20170082656
    • Publication date Mar 23, 2017
    • MPI Corporation
    • Tsung-Yi CHEN
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBING DEVICE
    • Publication number 20090009198
    • Publication date Jan 8, 2009
    • MJC Probe Incorporation
    • Wei-Cheng Ku
    • G01 - MEASURING TESTING
  • Information Patent Application

    Multi-function probe card
    • Publication number 20050184741
    • Publication date Aug 25, 2005
    • MJC Probe Inc.
    • Horng-Chuan Sun
    • G01 - MEASURING TESTING