Horng-Kuang FAN

Person

CHU-PEI CITY, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Probe module having cantilever MEMS probe and method of making the...
- Patent number 10,436,818
- Issue date Oct 8, 2019
- MPI Corporation
- Yu-Chen Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Spring probe and probe card having spring probe
- Patent number 10,393,773
- Issue date Aug 27, 2019
- MPI Corporation
- Tsung-Yi Chen
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe device and supporter used in the same
- Patent number 10,119,991
- Issue date Nov 6, 2018
- MPI Corporation
- Tsung-Yi Chen
- G01 - MEASURING TESTING
Information Patent Grant
Spring probe
- Patent number 9,506,949
- Issue date Nov 29, 2016
- MPI Corporation
- Yi-Lung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe head
- Patent number 9,470,715
- Issue date Oct 18, 2016
- MPI CORPORATION
- Horng-Kuang Fan
- G01 - MEASURING TESTING
Information Patent Grant
Assembling method and maintaining method for vertical probe device
- Patent number 9,465,050
- Issue date Oct 11, 2016
- MPI Corporation
- Tsung-Yi Chen
- G01 - MEASURING TESTING
Information Patent Grant
Current-diverting guide plate for probe module and probe module usi...
- Patent number 9,423,424
- Issue date Aug 23, 2016
- MPI Corporation
- Hsien-Ta Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Probe head of probe card and manufacturing method of composite boar...
- Patent number 9,110,130
- Issue date Aug 18, 2015
- MPI Corporation
- Ming-Chi Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Elastic micro high frequency probe
- Patent number 9,000,794
- Issue date Apr 7, 2015
- MPI Corporation
- Yi-Lung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,477,061
- Issue date Jan 13, 2009
- MJC Probe Incorporation
- Horng-Kuang Fan
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit probe card
- Patent number 7,154,284
- Issue date Dec 26, 2006
- MJC Probe Incorporation
- Horng-Kuang Fan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD
- Publication number 20190212368
- Publication date Jul 11, 2019
- MPI Corporation
- Hsien-Ta HSU
- G01 - MEASURING TESTING
Information Patent Application
PROBE MODULE HAVING CANTILEVER MEMS PROBE AND METHOD OF MAKING THE...
- Publication number 20180024163
- Publication date Jan 25, 2018
- MPI CORPORATION
- YU-CHEN HSU
- G01 - MEASURING TESTING
Information Patent Application
PROBE STRUCTURE AND PROBE DEVICE
- Publication number 20170192036
- Publication date Jul 6, 2017
- MPI Corporation
- Yi-Chien Tsai
- G01 - MEASURING TESTING
Information Patent Application
SPRING PROBE AND PROBE CARD HAVING SPRING PROBE
- Publication number 20170082656
- Publication date Mar 23, 2017
- MPI Corporation
- Tsung-Yi CHEN
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND METHOD FOR MANUFACTURING THE PROBE
- Publication number 20150355235
- Publication date Dec 10, 2015
- MPI Corporation
- Yu-Chen HSU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
VERTICAL PROBE DEVICE AND SUPPORTER USED IN THE SAME
- Publication number 20150276800
- Publication date Oct 1, 2015
- MPI Corporation
- Tsung-Yi CHEN
- G01 - MEASURING TESTING
Information Patent Application
ASSEMBLING METHOD AND MAINTAINING METHOD FOR VERTICAL PROBE DEVICE
- Publication number 20150253358
- Publication date Sep 10, 2015
- MPI Corporation
- Tsung-Yi CHEN
- G01 - MEASURING TESTING
Information Patent Application
SPRING PROBE
- Publication number 20150247882
- Publication date Sep 3, 2015
- MPI Corporation
- Yi-Lung LEE
- G01 - MEASURING TESTING
Information Patent Application
Probe Head
- Publication number 20140197859
- Publication date Jul 17, 2014
- MPI Corporation
- Horng- Kuang FAN
- G01 - MEASURING TESTING
Information Patent Application
CURRENT-DIVERTING GUIDE PLATE FOR PROBE MODULE AND PROBE MODULE USI...
- Publication number 20140197860
- Publication date Jul 17, 2014
- MPI Corporation
- Hsien-Ta HSU
- G01 - MEASURING TESTING
Information Patent Application
ELASTIC MICRO HIGH FREQUENCY PROBE
- Publication number 20120299612
- Publication date Nov 29, 2012
- Yi-Lung Lee
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD OF PROBE CARD AND MANUFACTURING METHOD OF COMPOSITE BOAR...
- Publication number 20120007627
- Publication date Jan 12, 2012
- Ming-Chi CHEN
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20070176614
- Publication date Aug 2, 2007
- MJC Probe Incorporation
- Horng-Kuang Fan
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PROBE CARD
- Publication number 20060022686
- Publication date Feb 2, 2006
- MJC PROBE INCORPORATION
- Horng-Kuang Fan
- G01 - MEASURING TESTING

Horng-Kuang FAN

Person

Patents Grantslast 30 patents

Probe module having cantilever MEMS probe and method of making the...

Spring probe and probe card having spring probe

Vertical probe device and supporter used in the same

Spring probe

Probe head

Assembling method and maintaining method for vertical probe device

Current-diverting guide plate for probe module and probe module usi...

Probe head of probe card and manufacturing method of composite boar...

Elastic micro high frequency probe

Probe card

Integrated circuit probe card

Patents Applicationslast 30 patents

PROBE CARD

PROBE MODULE HAVING CANTILEVER MEMS PROBE AND METHOD OF MAKING THE...

PROBE STRUCTURE AND PROBE DEVICE

SPRING PROBE AND PROBE CARD HAVING SPRING PROBE

PROBE AND METHOD FOR MANUFACTURING THE PROBE

VERTICAL PROBE DEVICE AND SUPPORTER USED IN THE SAME

ASSEMBLING METHOD AND MAINTAINING METHOD FOR VERTICAL PROBE DEVICE

SPRING PROBE

Probe Head

CURRENT-DIVERTING GUIDE PLATE FOR PROBE MODULE AND PROBE MODULE USI...

ELASTIC MICRO HIGH FREQUENCY PROBE

PROBE HEAD OF PROBE CARD AND MANUFACTURING METHOD OF COMPOSITE BOAR...

Probe card

INTEGRATED CIRCUIT PROBE CARD