Horst Engel

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Giessen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for the determination of layer thicknesses
- Patent number 6,826,511
- Issue date Nov 30, 2004
- Leica Microsystems Jena GmbH
- Hakon Mikkelsen
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement arrangement, in particular for layer thickness...
- Patent number 6,618,154
- Issue date Sep 9, 2003
- Leica Microsystems Jena GmbH
- Horst Engel
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement arrangement having an ellipsometer
- Patent number 6,600,560
- Issue date Jul 29, 2003
- Leica Microsystems Jena GmbH
- Hakon Mikkelsen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for automatic determination of optical parameters of a layer...
- Publication number 20040027580
- Publication date Feb 12, 2004
- Hans-Artur Bosser
- G01 - MEASURING TESTING
Information Patent Application
Method for the determination of layer thicknesses
- Publication number 20030147085
- Publication date Aug 7, 2003
- Leica Microsystems Jena GmbH
- Hakon Mikkelsen
- G01 - MEASURING TESTING
Information Patent Application
Optical measurement arrangement having an ellipsometer
- Publication number 20020027657
- Publication date Mar 7, 2002
- Hakon Mikkelsen
- G01 - MEASURING TESTING
Information Patent Application
Optical measurement arrangement, in particular for layer thickness...
- Publication number 20020003217
- Publication date Jan 10, 2002
- Horst Engel
- G01 - MEASURING TESTING