Horst R. Niehaus

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Tester architecture for testing semiconductor integrated circuits
- Patent number 6,956,394
- Issue date Oct 18, 2005
- Teseda Corporation
- Ajit M. Limaye
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Tester architecture for testing semiconductor integrated circuits
- Publication number 20040232936
- Publication date Nov 25, 2004
- Teseda Corporation
- Ajit M. Limaye
- G01 - MEASURING TESTING