Hosei NAKAHIRA

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for detecting polishing end in CMP polishing device, CMP pol...
- Patent number 7,981,309
- Issue date Jul 19, 2011
- Nikon Corporation
- Takehiko Ueda
- B24 - GRINDING POLISHING
Information Patent Grant
Flatness measuring apparatus
- Patent number 6,323,952
- Issue date Nov 27, 2001
- Nikon Corporation
- Masahiko Yomoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LENS UNIT AND IMAGE CAPTURING APPARATUS
- Publication number 20140049849
- Publication date Feb 20, 2014
- Nikon Corporation
- Hosei NAKAHIRA
- G02 - OPTICS
Information Patent Application
LENS UNIT AND IMAGE CAPTURING APPARATUS
- Publication number 20120194929
- Publication date Aug 2, 2012
- Nikon Corporation
- Hosei NAKAHIRA
- G02 - OPTICS
Information Patent Application
Method for Detecting Polishing End in CMP Polishing Device, CMP Pol...
- Publication number 20090233525
- Publication date Sep 17, 2009
- Takehiko Ueda
- B24 - GRINDING POLISHING