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Houri JOHARI-GALLE
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San Joe, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Drive and sense balanced, fully-coupled 3-axis gyroscope
Patent number
11,841,228
Issue date
Dec 12, 2023
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Drive and sense balanced, semi-coupled 3-axis gyroscope
Patent number
11,815,354
Issue date
Nov 14, 2023
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for operating a mems device based on sensed tem...
Patent number
11,738,994
Issue date
Aug 29, 2023
Invensense, Inc.
David deKoninck
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Demodulation phase calibration using external input
Patent number
11,650,078
Issue date
May 16, 2023
Invensense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Systems and methods for operating a MEMS device based on sensed tem...
Patent number
11,548,780
Issue date
Jan 10, 2023
Invensense, Inc.
David deKoninck
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Demodulation phase calibration using external input
Patent number
11,365,983
Issue date
Jun 21, 2022
Invensense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Electrode layer partitioning
Patent number
11,268,976
Issue date
Mar 8, 2022
Invensense, Inc.
Alexander Castro
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Systems and methods for operating a MEMS device based on sensed tem...
Patent number
11,186,479
Issue date
Nov 30, 2021
Invensense, Inc.
David deKoninck
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Sensor self-calibration
Patent number
11,156,631
Issue date
Oct 26, 2021
Invensense, Inc.
Matthew Julian Thompson
G01 - MEASURING TESTING
Information
Patent Grant
Drive and sense balanced, fully-coupled 3-axis gyroscope
Patent number
11,118,907
Issue date
Sep 14, 2021
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Vertical thermal gradient compensation in a z-axis MEMS accelerometer
Patent number
11,073,531
Issue date
Jul 27, 2021
Invensense, Inc.
David deKoninck
G01 - MEASURING TESTING
Information
Patent Grant
Device comprising a micro-electro-mechanical system substrate with...
Patent number
11,040,871
Issue date
Jun 22, 2021
Invensense, Inc.
Jongwoo Shin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Drive and sense balanced, semi-coupled 3-axis gyroscope
Patent number
10,914,584
Issue date
Feb 9, 2021
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
On-chip gap measurement
Patent number
10,794,702
Issue date
Oct 6, 2020
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Asymmetric out-of-plane accelerometer
Patent number
10,732,196
Issue date
Aug 4, 2020
Invensense, Inc.
Matthew Thompson
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS sensor with offset anchor load rejection
Patent number
10,571,268
Issue date
Feb 25, 2020
Invensense, Inc.
Matthew Thompson
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Proof mass and polysilicon electrode integrated thereon
Patent number
10,505,006
Issue date
Dec 10, 2019
Invensense, Inc.
Bongsang Kim
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS device with electrodes permeable to outgassing species
Patent number
9,663,349
Issue date
May 30, 2017
Invensense, Inc.
Jongwoo Shin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
DRIVE AND SENSE BALANCED, SEMI-COUPLED 3-AXIS GYROSCOPE
Publication number
20230324176
Publication date
Oct 12, 2023
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR OPERATING A MEMS DEVICE BASED ON SENSED TEM...
Publication number
20230107211
Publication date
Apr 6, 2023
InvenSense, Inc.
David deKoninck
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DEMODULATION PHASE CALIBRATION USING EXTERNAL INPUT
Publication number
20220326045
Publication date
Oct 13, 2022
InvenSense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ELECTRODE LAYER PARTITIONING
Publication number
20220144624
Publication date
May 12, 2022
InvenSense, Inc.
Alexander Castro
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SYSTEMS AND METHODS FOR OPERATING A MEMS DEVICE BASED ON SENSED TEM...
Publication number
20220048760
Publication date
Feb 17, 2022
InvenSense, Inc.
David deKoninck
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DRIVE AND SENSE BALANCED, FULLY-COUPLED 3-AXIS GYROSCOPE
Publication number
20210396519
Publication date
Dec 23, 2021
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
DRIVE AND SENSE BALANCED, SEMI-COUPLED 3-AXIS GYROSCOPE
Publication number
20210116244
Publication date
Apr 22, 2021
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
VERTICAL THERMAL GRADIENT COMPENSATION IN A Z-AXIS MEMS ACCELEROMETER
Publication number
20210055321
Publication date
Feb 25, 2021
InvenSense, Inc.
David deKoninck
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR OPERATING A MEMS DEVICE BASED ON SENSED TEM...
Publication number
20210053819
Publication date
Feb 25, 2021
InvenSense, Inc.
David deKoninck
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DRIVE AND SENSE BALANCED, FULLY-COUPLED 3-AXIS GYROSCOPE
Publication number
20200096337
Publication date
Mar 26, 2020
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
DEVICE COMPRISING A MICRO-ELECTRO-MECHANICAL SYSTEM SUBSTRATE WITH...
Publication number
20190185317
Publication date
Jun 20, 2019
InvenSense, Inc.
Jongwoo Shin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SENSOR SELF-CALIBRATION
Publication number
20190187172
Publication date
Jun 20, 2019
InvenSense, Inc.
Matthew Julian Thompson
G01 - MEASURING TESTING
Information
Patent Application
ON-CHIP GAP MEASUREMENT
Publication number
20190178645
Publication date
Jun 13, 2019
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
STRESS ISOLATION FRAME FOR A SENSOR
Publication number
20190169018
Publication date
Jun 6, 2019
InvenSense, Inc.
Doruk SENKAL
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS SENSOR WITH OFFSET ANCHOR LOAD REJECTION
Publication number
20190162538
Publication date
May 30, 2019
InvenSense, Inc.
Matthew Thompson
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ASYMMETRIC OUT-OF-PLANE ACCELEROMETER
Publication number
20190162747
Publication date
May 30, 2019
InvenSense, Inc.
Matthew Thompson
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DEMODULATION PHASE CALIBRATION USING EXTERNAL INPUT
Publication number
20190120657
Publication date
Apr 25, 2019
InvenSense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PROOF MASS AND POLYSILICON ELECTRODE INTEGRATED THEREON
Publication number
20190035905
Publication date
Jan 31, 2019
InvenSense, Inc.
Bongsang KIM
G01 - MEASURING TESTING
Information
Patent Application
ELECTRODE LAYER PARTITIONING
Publication number
20180238927
Publication date
Aug 23, 2018
InvenSense, Inc.
Alexander Castro
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DRIVE AND SENSE BALANCED, SEMI-COUPLED 3-AXIS GYROSCOPE
Publication number
20180216935
Publication date
Aug 2, 2018
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
MEMS DEVICE WITH ELECTRODES PERMEABLE TO OUTGASSING SPECIES
Publication number
20160376143
Publication date
Dec 29, 2016
InvenSense, Inc.
Jongwoo SHIN
B81 - MICRO-STRUCTURAL TECHNOLOGY