Houssam Chouaib

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Bandgap measurements of patterned film stacks using spectroscopic m...
- Patent number 11,796,390
- Issue date Oct 24, 2023
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Grant
Scatterometry based methods and systems for measurement of strain i...
- Patent number 11,573,077
- Issue date Feb 7, 2023
- KLA Corporation
- Houssam Chouaib
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measuring thin films on grating and bandgap on grating
- Patent number 11,555,689
- Issue date Jan 17, 2023
- KLA-Tencor Corporation
- Houssam Chouaib
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bandgap measurements of patterned film stacks using spectroscopic m...
- Patent number 11,378,451
- Issue date Jul 5, 2022
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Grant
Measurement methodology of advanced nanostructures
- Patent number 11,156,548
- Issue date Oct 26, 2021
- KLA-Tencor Corporation
- Manh Nguyen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Visualization of three-dimensional semiconductor structures
- Patent number 11,099,137
- Issue date Aug 24, 2021
- KLA Corporation
- Aaron J. Rosenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scatterometry based methods and systems for measurement of strain i...
- Patent number 11,060,846
- Issue date Jul 13, 2021
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Grant
Measurement models of nanowire semiconductor structures based on re...
- Patent number 11,036,898
- Issue date Jun 15, 2021
- KLA-Tencor Corporation
- Houssam Chouaib
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Visualization of three-dimensional semiconductor structures
- Patent number 10,794,839
- Issue date Oct 6, 2020
- KLA Corporation
- Aaron J. Rosenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring thin films on grating and bandgap on grating
- Patent number 10,663,286
- Issue date May 26, 2020
- KLA-Tencor Corporation
- Houssam Chouaib
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Model based optical measurements of semiconductor structures with a...
- Patent number 10,458,912
- Issue date Oct 29, 2019
- KLA-Tencor Corporation
- Houssam Chouaib
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for nondestructively measuring concentration and...
- Patent number 8,804,106
- Issue date Aug 12, 2014
- KLA-Tencor Corporation
- NanChang Zhu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Flexible Measurement Models For Model Based Measurements Of Semicon...
- Publication number 20250053096
- Publication date Feb 13, 2025
- KLA Corporation
- Houssam Chouaib
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SPATIALLY-VARYING SPECTRAL METROLOGY FOR LOCAL VARIATION DETECTION
- Publication number 20250053098
- Publication date Feb 13, 2025
- KLA Corporation
- Zhengquan Tan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Multiple Pass Optical Measurements Of Semiconductor Structures
- Publication number 20250012734
- Publication date Jan 9, 2025
- KLA Corporation
- Zhengquan Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTIL...
- Publication number 20250005435
- Publication date Jan 2, 2025
- KLA Corporation
- Houssam Chouaib
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTIL...
- Publication number 20250004384
- Publication date Jan 2, 2025
- KLA Corporation
- Zhaxylyk Kudyshev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTIL...
- Publication number 20250004047
- Publication date Jan 2, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY OF NANOSHEET SURFACE ROUGHNESS AND PROFILE
- Publication number 20240377758
- Publication date Nov 14, 2024
- KLA Corporation
- Houssam Chouaib
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods And Systems For Measurement Of Semiconductor Structures Bas...
- Publication number 20240151770
- Publication date May 9, 2024
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...
- Publication number 20220349752
- Publication date Nov 3, 2022
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Application
Scatterometry Based Methods And Systems For Measurement Of Strain I...
- Publication number 20210293532
- Publication date Sep 23, 2021
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
Visualization of Three-Dimensional Semiconductor Structures
- Publication number 20200393386
- Publication date Dec 17, 2020
- KLA Corporation
- Aaron J. Rosenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Visualization of Three-Dimensional Semiconductor Structures
- Publication number 20200271595
- Publication date Aug 27, 2020
- KLA-Tencor Corporation
- Aaron J. Rosenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measuring Thin Films on Grating and Bandgap on Grating
- Publication number 20200240768
- Publication date Jul 30, 2020
- KLA-Tencor Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
Scatterometry Based Methods And Systems For Measurement Of Strain I...
- Publication number 20200200525
- Publication date Jun 25, 2020
- KLA Corporation
- Houssam Chouaib
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Measurement Models Of Nanowire Semiconductor Structures Based On Re...
- Publication number 20190286787
- Publication date Sep 19, 2019
- KLA-Tencor Corporation
- Houssam Chouaib
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measurement Methodology of Advanced Nanostructures
- Publication number 20190178788
- Publication date Jun 13, 2019
- KLA-Tencor Corporation
- Manh Nguyen
- G05 - CONTROLLING REGULATING
Information Patent Application
Measuring Thin Films on Grating and Bandgap on Grating
- Publication number 20190063900
- Publication date Feb 28, 2019
- KLA-Tencor Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...
- Publication number 20190041266
- Publication date Feb 7, 2019
- KLA-Tencor Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Application
MODEL BASED OPTICAL MEASUREMENTS OF SEMICONDUCTOR STRUCTURES WITH A...
- Publication number 20180059019
- Publication date Mar 1, 2018
- KLA-Tencor Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR NONDESTRUCTIVELY MEASURING CONCENTRATION AND...
- Publication number 20130003050
- Publication date Jan 3, 2013
- KLA-Tencor Corporation
- NanChang Zhu
- G01 - MEASURING TESTING

Houssam Chouaib

Person

Patents Grantslast 30 patents

Bandgap measurements of patterned film stacks using spectroscopic m...

Scatterometry based methods and systems for measurement of strain i...

Measuring thin films on grating and bandgap on grating

Bandgap measurements of patterned film stacks using spectroscopic m...

Measurement methodology of advanced nanostructures

Visualization of three-dimensional semiconductor structures

Scatterometry based methods and systems for measurement of strain i...

Measurement models of nanowire semiconductor structures based on re...

Visualization of three-dimensional semiconductor structures

Measuring thin films on grating and bandgap on grating

Model based optical measurements of semiconductor structures with a...

System and method for nondestructively measuring concentration and...

Patents Applicationslast 30 patents

Flexible Measurement Models For Model Based Measurements Of Semicon...

SPATIALLY-VARYING SPECTRAL METROLOGY FOR LOCAL VARIATION DETECTION

Multiple Pass Optical Measurements Of Semiconductor Structures

METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTIL...

METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTIL...

METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTIL...

METROLOGY OF NANOSHEET SURFACE ROUGHNESS AND PROFILE

Methods And Systems For Measurement Of Semiconductor Structures Bas...

Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...

Scatterometry Based Methods And Systems For Measurement Of Strain I...

Visualization of Three-Dimensional Semiconductor Structures

Visualization of Three-Dimensional Semiconductor Structures

Measuring Thin Films on Grating and Bandgap on Grating

Scatterometry Based Methods And Systems For Measurement Of Strain I...

Measurement Models Of Nanowire Semiconductor Structures Based On Re...

Measurement Methodology of Advanced Nanostructures

Measuring Thin Films on Grating and Bandgap on Grating

Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...

MODEL BASED OPTICAL MEASUREMENTS OF SEMICONDUCTOR STRUCTURES WITH A...

SYSTEM AND METHOD FOR NONDESTRUCTIVELY MEASURING CONCENTRATION AND...