Howard I. Dwyer

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for automatic wafer inspection
- Patent number 4,618,938
- Issue date Oct 21, 1986
- KLA Instruments Corporation
- Paul Sandland
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-Y Stage for a patterned wafer automatic inspection system
- Patent number 4,556,317
- Issue date Dec 3, 1985
- KLA Instruments Corporation
- Paul Sandland
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY