Hsiang-Kai Liao

Person

Taipei, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method for measuring and analyzing surface structure of chip or wafer
- Patent number 9,589,086
- Issue date Mar 7, 2017
- Macronix International Co., Ltd.
- Tuung Luoh
- G02 - OPTICS
Information Patent Grant
Method for detecting an electrical defect of contact/via plugs
- Patent number 9,244,112
- Issue date Jan 26, 2016
- Macronix International Co., Ltd.
- Hsiang-Chou Liao
- G01 - MEASURING TESTING
Information Patent Grant
In-line inspection yield prediction system
- Patent number 8,594,963
- Issue date Nov 26, 2013
- Macronix International Co., Ltd.
- Hsiang-Chou Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test pattern for detecting piping in a memory array
- Patent number 8,329,480
- Issue date Dec 11, 2012
- Macronix International Co., Ltd.
- Che-Lun Hung
- G11 - INFORMATION STORAGE
Information Patent Grant
Camera module, fabricating method and cleaning method thereof
- Patent number 7,934,879
- Issue date May 3, 2011
- Primax Electronics Ltd.
- Hsiang-Kai Liao
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR GATE AND CONTACT FORMATION
- Publication number 20240387644
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsin-Han TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR GATE AND CONTACT FORMATION
- Publication number 20230343834
- Publication date Oct 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsin-Han TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE WITH METAL GATE
- Publication number 20230268409
- Publication date Aug 24, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Wei CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection of inconsistencies in and on semiconductor devices and s...
- Publication number 20160123905
- Publication date May 5, 2016
- Macronix International Co., Ltd.
- Hsiang-Chou Liao
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING AN ELECTRICAL DEFECT OF CONTACT/VIA PLUGS
- Publication number 20150323583
- Publication date Nov 12, 2015
- Macronix International Co., Ltd.
- Hsiang-Chou Liao
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING AND ANALYZING SURFACE STRUCTURE OF CHIP OR WAFER
- Publication number 20150213172
- Publication date Jul 30, 2015
- Macronix International Co., Ltd.
- Tuung Luoh
- G01 - MEASURING TESTING
Information Patent Application
IMAGE INSPECTION METHOD OF DIE TO DATABASE
- Publication number 20150110384
- Publication date Apr 23, 2015
- Macronix International Co., Ltd.
- Tuung Luoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST PATTERN FOR DETECTING PIPING IN A MEMORY ARRAY
- Publication number 20120074401
- Publication date Mar 29, 2012
- MACRONIX INTERNATIONAL CO., LTD
- Che-Lun Hung
- G11 - INFORMATION STORAGE
Information Patent Application
IN-LINE INSPECTION YIELD PREDICTION SYSTEM
- Publication number 20120053855
- Publication date Mar 1, 2012
- MACRONIX INTERNATIONAL CO., LTD
- Hsiang-Chou Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CAMERA MODULE, FABRICATING METHOD AND CLEANING METHOD THEREOF
- Publication number 20100224216
- Publication date Sep 9, 2010
- Primax Electronics Ltd.
- Hsiang-Kai Liao
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Hsiang-Kai Liao

Person

Patents Grantslast 30 patents

Method for measuring and analyzing surface structure of chip or wafer

Method for detecting an electrical defect of contact/via plugs

In-line inspection yield prediction system

Test pattern for detecting piping in a memory array

Camera module, fabricating method and cleaning method thereof

Patents Applicationslast 30 patents

SEMICONDUCTOR GATE AND CONTACT FORMATION

SEMICONDUCTOR GATE AND CONTACT FORMATION

STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE WITH METAL GATE

Inspection of inconsistencies in and on semiconductor devices and s...

METHOD FOR DETECTING AN ELECTRICAL DEFECT OF CONTACT/VIA PLUGS

METHOD FOR MEASURING AND ANALYZING SURFACE STRUCTURE OF CHIP OR WAFER

IMAGE INSPECTION METHOD OF DIE TO DATABASE

TEST PATTERN FOR DETECTING PIPING IN A MEMORY ARRAY

IN-LINE INSPECTION YIELD PREDICTION SYSTEM

CAMERA MODULE, FABRICATING METHOD AND CLEANING METHOD THEREOF