Hsiang-Min Lin

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Taipei Hsien, TW

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit with self-proofreading function, measuring devic...
- Patent number 7,490,025
- Issue date Feb 10, 2009
- De Poan Pneumatic Corp.
- Po-Yin Chao
- G01 - MEASURING TESTING
Information Patent Grant
Method for programming one-time programmable memory of integrated c...
- Patent number 7,440,306
- Issue date Oct 21, 2008
- Fortune Semiconductor Corporation
- Po-Yin Chao
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit with self-proofreading function and measuring de...
- Patent number 7,428,474
- Issue date Sep 23, 2008
- Fortune Semiconductor Corporation
- Po-Yin Chao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Programming one-time Programmable Memory of Integrated C...
- Publication number 20080043508
- Publication date Feb 21, 2008
- Po-Yin Chao
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated Circuit with Self-Proofreading Function and Measuring De...
- Publication number 20080046219
- Publication date Feb 21, 2008
- Po-Yin Chao
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit with Self-Proofreading Function, Measuring Devic...
- Publication number 20080046182
- Publication date Feb 21, 2008
- Po-Yin Chao
- G01 - MEASURING TESTING