HSIAO TING TSENG

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HSINCHU CITY, TW

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Patents Grantslast 30 patents

Information Patent Grant
Testing apparatus
- Patent number 11,209,462
- Issue date Dec 28, 2021
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus, holding assembly, and probe card carrier
- Patent number 10,184,957
- Issue date Jan 22, 2019
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Test assembly
- Patent number 9,739,830
- Issue date Aug 22, 2017
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Testing device
- Patent number 9,535,114
- Issue date Jan 3, 2017
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
High-precision semiconductor device probing apparatus and system th...
- Patent number 9,329,205
- Issue date May 3, 2016
- Star Technologies Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING APPARATUS, HOLDING ASSEMBLY, AND PROBE CARD CARRIER
- Publication number 20170370966
- Publication date Dec 28, 2017
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
TEST ASSEMBLY
- Publication number 20140340105
- Publication date Nov 20, 2014
- STAR TECHNOLOGIES, INC.
- Choon Leong LOU
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE
- Publication number 20140145740
- Publication date May 29, 2014
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
HIGH-PRECISION SEMICONDUCTOR DEVICE PROBING APPARATUS AND SYSTEM TH...
- Publication number 20130249584
- Publication date Sep 26, 2013
- STAR TECHNOLOGIES INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING