Hsiao Wen CHUNG

Person

Taipei City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor structure and method for forming features in redundan...
- Patent number 11,855,010
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shan-Yu Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining ischemic status or assessing stroke onset ti...
- Patent number 11,826,136
- Issue date Nov 28, 2023
- Taipei Medical University
- Cheng-Yu Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dummy patterns in redundant region of double seal ring
- Patent number 11,728,229
- Issue date Aug 15, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shan-Yu Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip structure and method for forming the same
- Patent number 11,688,708
- Issue date Jun 27, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shan-Yu Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining ischemic status or assessing stroke onset ti...
- Patent number 11,229,375
- Issue date Jan 25, 2022
- Taipei Medical University
- Cheng-Yu Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting temperature and protein denaturation during thermal therapy
- Patent number 8,229,544
- Issue date Jul 24, 2012
- National Health Research Institutes
- Wen-Yih Isaac Tseng
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Formation of prescribed pattern on wafer for use in SEM defect offset
- Patent number 8,208,714
- Issue date Jun 26, 2012
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mu-Chieh Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Dummy Patterns in Redundant Region of Double Seal Ring
- Publication number 20230369148
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shan-Yu Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20230360917
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Meng-Hsiu HSIEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP STRUCTURE WITH CONDUCTIVE PILLAR AND METHOD FOR FORMING THE SAME
- Publication number 20230253356
- Publication date Aug 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shan-Yu HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHIP STRUCTURE AND METHOD FOR FORMING THE SAME
- Publication number 20230068503
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shan-Yu HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING FEATURES IN REDUNDAN...
- Publication number 20230041160
- Publication date Feb 9, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shan-Yu HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANDREL FIN DESIGN FOR DOUBLE SEAL RING
- Publication number 20230010037
- Publication date Jan 12, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shan-Yu Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dummy Patterns in Redundant Region of Double Seal Ring
- Publication number 20220310464
- Publication date Sep 29, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shan-Yu Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING ISCHEMIC STATUS OR ASSESSING STROKE ONSET TI...
- Publication number 20220095945
- Publication date Mar 31, 2022
- TAIPEI MEDICAL UNIVERSITY
- Cheng-Yu CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING ISCHEMIC STATUS OR ASSESSING STROKE ONSET TI...
- Publication number 20190029557
- Publication date Jan 31, 2019
- TAIPEI MEDICAL UNIVERSITY
- Cheng-Yu CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FORMATION OF PRESCRIBED PATTERN ON WAFER FOR USE IN SEM DEFECT OFFSET
- Publication number 20100296722
- Publication date Nov 25, 2010
- Taiwan Semiconductor Manufacturing Co., LTD
- Mu-Chieh LIU
- G01 - MEASURING TESTING
Information Patent Application
DETECTING TEMPERATURE AND PROTEIN DENATURATION DURING THERMAL THERAPY
- Publication number 20080275331
- Publication date Nov 6, 2008
- National Health Research Institutes
- Wen-Yih Isaac Tseng
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Hsiao Wen CHUNG

Person

Patents Grantslast 30 patents

Semiconductor structure and method for forming features in redundan...

Method for determining ischemic status or assessing stroke onset ti...

Dummy patterns in redundant region of double seal ring

Chip structure and method for forming the same

Method for determining ischemic status or assessing stroke onset ti...

Detecting temperature and protein denaturation during thermal therapy

Formation of prescribed pattern on wafer for use in SEM defect offset

Patents Applicationslast 30 patents

Dummy Patterns in Redundant Region of Double Seal Ring

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

CHIP STRUCTURE WITH CONDUCTIVE PILLAR AND METHOD FOR FORMING THE SAME

CHIP STRUCTURE AND METHOD FOR FORMING THE SAME

SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING FEATURES IN REDUNDAN...

MANDREL FIN DESIGN FOR DOUBLE SEAL RING

Dummy Patterns in Redundant Region of Double Seal Ring

METHOD FOR DETERMINING ISCHEMIC STATUS OR ASSESSING STROKE ONSET TI...

METHOD FOR DETERMINING ISCHEMIC STATUS OR ASSESSING STROKE ONSET TI...

FORMATION OF PRESCRIBED PATTERN ON WAFER FOR USE IN SEM DEFECT OFFSET

DETECTING TEMPERATURE AND PROTEIN DENATURATION DURING THERMAL THERAPY