Hsieh Chi-Jen

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Toufen Township, TW

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Patents Grantslast 30 patents

Information Patent Grant
Automated wafer inspection
- Patent number 9,575,012
- Issue date Feb 21, 2017
- Taiwan Semiconductor Manufacturing Company Limited
- Hu-Wei Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED WAFER INSPECTION
- Publication number 20140267692
- Publication date Sep 18, 2014
- Taiwan Semiconductor Manufacturing Company Limited
- Lin Hu-Wei
- G01 - MEASURING TESTING