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GUANSI TOWNSHIP, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Probe module supporting loopback test
Patent number
9,500,675
Issue date
Nov 22, 2016
MPI Corporation
Wei-Cheng Ku
G01 - MEASURING TESTING
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Patent Grant
Signal path switch and probe card having the signal path switch
Patent number
9,442,134
Issue date
Sep 13, 2016
MPI Corporation
Wei-Cheng Ku
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PROBE MODULE SUPPORTING LOOPBACK TEST
Publication number
20150015290
Publication date
Jan 15, 2015
MPI CORPORATION
WEI-CHENG KU
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL PATH SWITCH AND PROBE CARD HAVING THE SIGNAL PATH SWITCH
Publication number
20150015295
Publication date
Jan 15, 2015
MPI CORPORATION
WEI-CHENG KU
G01 - MEASURING TESTING