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Hsin Lan Pang

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  • Hsinchu, TW
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Patents Grantslast 30 patents

  • Information Patent Grant

    Overlay measurement target
    • Patent number 7,379,184
    • Issue date May 27, 2008
    • Nanometrics Incorporated
    • Nigel Peter Smith
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    Overlay Measurement Target
    • Publication number 20080217794
    • Publication date Sep 11, 2008
    • Industrial Technology Research Institute
    • Nigel Peter Smith
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Overlay measurement target
    • Publication number 20060151890
    • Publication date Jul 13, 2006
    • Accent Optical Technologies, Inc.
    • Nigel Peter Smith
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY