Hsin-Ta Hsieh

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Tainan, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method for correcting critical dimension measurements of lithograph...
- Patent number 12,147,163
- Issue date Nov 19, 2024
- United Microelectronics Corp.
- Hsin-Yu Hsieh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of forming a semiconductor device
- Patent number 11,488,829
- Issue date Nov 1, 2022
- United Microelectronics Corp.
- Kuan-Ying Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etching back method
- Patent number 10,777,420
- Issue date Sep 15, 2020
- United Microelectronics Corp.
- Kuan-Ying Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of semiconductor device
- Patent number 9,685,520
- Issue date Jun 20, 2017
- United Microelectronics Corp.
- Shuo-Lin Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etching method for reducing microloading effect
- Patent number 9,443,741
- Issue date Sep 13, 2016
- United Microelectronics Corp.
- Po-Wen Su
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CORRECTING CRITICAL DIMENSION MEASUREMENTS OF LITHOGRAPH...
- Publication number 20230152714
- Publication date May 18, 2023
- United Microelectronics Corp.
- Hsin-Yu HSIEH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF FORMING A SEMICONDUCTOR DEVICE
- Publication number 20220367192
- Publication date Nov 17, 2022
- UNITED MICROELECTRONICS CORP.
- Kuan-Ying Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ETCHING BACK METHOD
- Publication number 20200273714
- Publication date Aug 27, 2020
- UNITED MICROELECTRONICS CORP.
- Kuan-Ying Lai
- H01 - BASIC ELECTRIC ELEMENTS