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Hsing-Piao Hsu

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  • Hsin-Chu, TW
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    BROADBAND WAFER DEFECT DETECTION
    • Publication number 20240068957
    • Publication date Feb 29, 2024
    • TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    • Nai-Han CHENG
    • G01 - MEASURING TESTING
  • Information Patent Application

    ION IMPLANTATION GAS SUPPLY SYSTEM
    • Publication number 20230113582
    • Publication date Apr 13, 2023
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Hsing-Piao HSU
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Application

    Structure and Formation Method of Semiconductor Device with Fin Str...
    • Publication number 20210375697
    • Publication date Dec 2, 2021
    • Taiwan Semiconductor Manufacturing Co., LTD
    • Hsing-Hui Hsu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    BROADBAND WAFER DEFECT DETECTION
    • Publication number 20210333220
    • Publication date Oct 28, 2021
    • TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    • Nai-Han CHENG
    • G01 - MEASURING TESTING
  • Information Patent Application

    ION IMPLANTATION GAS SUPPLY SYSTEM
    • Publication number 20210319978
    • Publication date Oct 14, 2021
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Hsing-Piao HSU
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Application

    ION IMPANTATION GAS SUPPLY SYSTEM
    • Publication number 20200395193
    • Publication date Dec 17, 2020
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Hsing-Piao HSU
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Application

    Structure and Formation Method of Semiconductor Device with Fin Str...
    • Publication number 20200105622
    • Publication date Apr 2, 2020
    • Taiwan Semiconductor Manufacturing Co., LTD
    • Hsing-Hui Hsu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    BROADBAND WAFER DEFECT DETECTION
    • Publication number 20190162676
    • Publication date May 30, 2019
    • TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    • Nai-Han CHENG
    • G01 - MEASURING TESTING