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Taipei, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Method of reducing microloading effect
Patent number
8,377,632
Issue date
Feb 19, 2013
Nanya Technology Corp.
Hsiu-Chun Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming a trench by a silicon-containing mask
Patent number
8,252,684
Issue date
Aug 28, 2012
Nanya Technology Corp.
Hsiu-Chun Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of fabricating an isolation shallow trench
Patent number
7,569,451
Issue date
Aug 4, 2009
Nanya Technology Corp.
Jen-Jui Huang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for forming shallow trench in semiconductor device
Patent number
6,974,741
Issue date
Dec 13, 2005
NANYA Technology Corporatiion
Hsiu-Chun Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multifunctional storage case
Patent number
6,050,404
Issue date
Apr 18, 2000
Hsiu-Hui Lee
G11 - INFORMATION STORAGE
Information
Patent Grant
Continuously rectifiable linearity coil circuit
Patent number
5,742,152
Issue date
Apr 21, 1998
Chuntex Eletronic Co., Ltd.
Hsiu-Chyi Lee
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
Publication number
20160351678
Publication date
Dec 1, 2016
NANYA Technology Corp.
Shin-Yu Nieh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
Publication number
20140264640
Publication date
Sep 18, 2014
NANYA Technology Corp.
Shin-Yu Nieh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF REDUCING STRIATION ON A SIDEWALL OF A RECESS
Publication number
20120305525
Publication date
Dec 6, 2012
Hsiu-Chun Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF FABRICATING A DEEP TRENCH DEVICE
Publication number
20120302030
Publication date
Nov 29, 2012
Hsiu-Chun Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF REDUCING MICROLOADING EFFECT
Publication number
20120301833
Publication date
Nov 29, 2012
Hsiu-Chun Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TESTING PROBE AND ELECTRICAL CONNECTION METHOD USING THE SAME
Publication number
20090096473
Publication date
Apr 16, 2009
Compal Electronics, Inc.
Jung-Ju Tsai
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF FABRICATING AN ISOLATION SHALLOW TRENCH
Publication number
20080286935
Publication date
Nov 20, 2008
Jen-Jui Huang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LOCAL TEMPERATURE CONTROL FIXTURE APPLIED TO REFLOW PROCESS FOR CIR...
Publication number
20080149370
Publication date
Jun 26, 2008
Compal Electronics, Inc.
Hsiu-Feng Lee
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD OF FABRICATING TRENCH ISOLATION FOR TRENCH-CAPACITOR DRAM DE...
Publication number
20060154435
Publication date
Jul 13, 2006
Hsiu-Chun Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for forming shallow trench in semiconductor device
Publication number
20050148152
Publication date
Jul 7, 2005
NANYA TECHNOLOGY CORPORATION
Hsiu-Chun Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for processing photoresist
Publication number
20050147926
Publication date
Jul 7, 2005
NANYA TECHNOLOGY CORPORATION
Hsiu-Chun Lee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD FOR CONTROLLING CRITICAL DIMENSION BY UTILIZING RESIST SIDEW...
Publication number
20050118531
Publication date
Jun 2, 2005
Hsiu-Chun Lee
H01 - BASIC ELECTRIC ELEMENTS