Hsiu Lan Pang

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Baoshan Township, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method for designing two-dimensional array overlay targets and meth...
- Patent number 8,321,821
- Issue date Nov 27, 2012
- Industrial Technology Research Institute
- Yi Sha Ku
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for designing two-dimensional array overlay target sets and...
- Patent number 8,250,497
- Issue date Aug 21, 2012
- Industrial Technology Research Institute
- Wei Te Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for via structure measurement
- Patent number 8,139,233
- Issue date Mar 20, 2012
- Industrial Technology Research Institute
- Yi Sha Ku
- G01 - MEASURING TESTING
Information Patent Grant
Overlay measurement target
- Patent number 7,847,939
- Issue date Dec 7, 2010
- Nanometrics Incorporated
- Nigel Peter Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and systems for determining overlay error based on target i...
- Patent number 7,477,396
- Issue date Jan 13, 2009
- Nanometrics Incorporated
- Nigel Peter Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
THIN METAL FILM MEASUREMENT METHOD
- Publication number 20120290239
- Publication date Nov 15, 2012
- Industrial Technology Research Institute
- Yi-Sha Ku
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR VIA STRUCTURE MEASUREMENT
- Publication number 20110172974
- Publication date Jul 14, 2011
- Industrial Technology Research Institute
- Yi Sha KU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DESIGNING TWO-DIMENSIONAL ARRAY OVERLAY TARGET SETS AND...
- Publication number 20110154272
- Publication date Jun 23, 2011
- Industrial Technology Research Institute
- Wei Te Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DESIGNING TWO-DIMENSIONAL ARRAY OVERLAY TARGETS AND METH...
- Publication number 20110131538
- Publication date Jun 2, 2011
- Industrial Technology Research Institute
- Yi Sha KU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and systems for determining overlay error based on target i...
- Publication number 20060197950
- Publication date Sep 7, 2006
- Nigel Peter Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY