HSIU-WEN HSUEH

Person

TAICHUNG CITY, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device structure with resistive element
- Patent number 12,119,262
- Issue date Oct 15, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wen-Sheh Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor structure with resistive ele...
- Patent number 12,040,178
- Issue date Jul 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned scheme for semiconductor device and method of forming...
- Patent number 11,901,228
- Issue date Feb 13, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cai-Ling Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned scheme for semiconductor device and method of forming...
- Patent number 11,830,770
- Issue date Nov 28, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structure with resistive element
- Patent number 11,798,848
- Issue date Oct 24, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wen-Sheh Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diffusion barrier layer for conductive via to decrease contact resi...
- Patent number 11,742,291
- Issue date Aug 29, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Barrier free interface between beol interconnects
- Patent number 11,694,926
- Issue date Jul 4, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structure with resistive elements
- Patent number 11,670,501
- Issue date Jun 6, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inter-wire cavity for low capacitance
- Patent number 11,551,968
- Issue date Jan 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
E-fuse enhancement by underlayer layout design
- Patent number 11,410,926
- Issue date Aug 9, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- An-Jiao Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diffusion barrier layer for conductive via to decrease contact resi...
- Patent number 11,362,035
- Issue date Jun 14, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned scheme for semiconductor device and method of forming...
- Patent number 11,342,222
- Issue date May 24, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming semiconductor device with resistive element
- Patent number 11,217,482
- Issue date Jan 4, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Sheh Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and formation method of semiconductor device with resisti...
- Patent number 10,985,011
- Issue date Apr 20, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and formation method of semiconductor device with resisti...
- Patent number 10,515,852
- Issue date Dec 24, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Sheh Huang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DIFFUSION BARRIER LAYER FOR CONDUCTIVE VIA TO DECREASE CONTACT RESI...
- Publication number 20240404953
- Publication date Dec 5, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ONE-TIME-PROGRAMMABLE DEVICE STRUCTURE
- Publication number 20240387365
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Hsiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-ALIGNED INTERCONNECT STRUCTURE AND METHOD OF FORMING THE SAME
- Publication number 20240379436
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Cai-Ling Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDUCTIVE STRUCTURE IN SEMICONDUCTOR STRUCTURE AND METHOD FOR FORM...
- Publication number 20240266279
- Publication date Aug 8, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Cai-Ling WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMAL SENSOR DEVICE BY BACK END OF LINE METAL RESISTOR
- Publication number 20240249991
- Publication date Jul 25, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Hsiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-ALIGNED SCHEME FOR SEMICONDUCTOR DEVICE AND METHOD OF FORMING...
- Publication number 20230411210
- Publication date Dec 21, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-ALIGNED SCHEME FOR SEMICONDUCTOR DEVICE AND METHOD OF FORMING...
- Publication number 20230377966
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cai-Ling Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH BARRIER LAYER AND METHOD FOR FO...
- Publication number 20230369226
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Cai-Ling WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFUSION BARRIER LAYER FOR CONDUCTIVE VIA TO DECREASE CONTACT RESI...
- Publication number 20230335499
- Publication date Oct 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH RESISTIVE ELEMENT
- Publication number 20230326795
- Publication date Oct 12, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Sheh HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ONE-TIME-PROGRAMMABLE DEVICE STRUCTURE
- Publication number 20230307356
- Publication date Sep 28, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Hsiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BARRIER FREE INTERFACE BETWEEN BEOL INTERCONNECTS
- Publication number 20230290678
- Publication date Sep 14, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE WITH RESISTIVE ELE...
- Publication number 20230268176
- Publication date Aug 24, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiu-Wen HSUEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Forming Interconnect Structures in Semiconductor Devices
- Publication number 20230060269
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Self-Aligned Interconnect Structure And Method Of Forming The Same
- Publication number 20230011792
- Publication date Jan 12, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Cai-Ling Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
E-Fuse Enhancement By Underlayer Layout Design
- Publication number 20220375859
- Publication date Nov 24, 2022
- Taiwan Semiconductor Manufacturing Co., LTD
- An-Jiao Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTER-WIRE CAVITY FOR LOW CAPACITANCE
- Publication number 20220359266
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Self-Aligned Scheme for Semiconductor Device and Method of Forming...
- Publication number 20220319922
- Publication date Oct 6, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cai-Ling Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFUSION BARRIER LAYER FOR CONDUCTIVE VIA TO DECREASE CONTACT RESI...
- Publication number 20220310526
- Publication date Sep 29, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Self-Aligned Scheme for Semiconductor Device and Method of Forming...
- Publication number 20220277991
- Publication date Sep 1, 2022
- Taiwan Semiconductor Manufacturing Co., LTD
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH RESISTIVE ELEMENT
- Publication number 20220130727
- Publication date Apr 28, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Sheh HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BARRIER FREE INTERFACE BETWEEN BEOL INTERCONNECTS
- Publication number 20210335663
- Publication date Oct 28, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTER-WIRE CAVITY FOR LOW CAPACITANCE
- Publication number 20210335655
- Publication date Oct 28, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFUSION BARRIER LAYER FOR CONDUCTIVE VIA TO DECREASE CONTACT RESI...
- Publication number 20210287994
- Publication date Sep 16, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH RESISTIVE ELEMENTS
- Publication number 20210249251
- Publication date Aug 12, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiu-Wen HSUEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Self-Aligned Scheme for Semiconductor Device and Method of Forming...
- Publication number 20210098290
- Publication date Apr 1, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsiu-Wen Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
E-Fuse Enhancement By Underlayer Layout Design
- Publication number 20210098372
- Publication date Apr 1, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- An-Jiao Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING SEMICONDUCTOR DEVICE WITH RESISTIVE ELEMENT
- Publication number 20200118876
- Publication date Apr 16, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Sheh HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE WITH RESISTI...
- Publication number 20190139826
- Publication date May 9, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Sheh HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE WITH RESISTI...
- Publication number 20190139754
- Publication date May 9, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsiu-Wen HSUEH
- H01 - BASIC ELECTRIC ELEMENTS

HSIU-WEN HSUEH

Person

Patents Grantslast 30 patents

Semiconductor device structure with resistive element

Method for manufacturing semiconductor structure with resistive ele...

Self-aligned scheme for semiconductor device and method of forming...

Self-aligned scheme for semiconductor device and method of forming...

Semiconductor device structure with resistive element

Diffusion barrier layer for conductive via to decrease contact resi...

Barrier free interface between beol interconnects

Semiconductor device structure with resistive elements

Inter-wire cavity for low capacitance

E-fuse enhancement by underlayer layout design

Diffusion barrier layer for conductive via to decrease contact resi...

Self-aligned scheme for semiconductor device and method of forming...

Method for forming semiconductor device with resistive element

Structure and formation method of semiconductor device with resisti...

Structure and formation method of semiconductor device with resisti...

Patents Applicationslast 30 patents

DIFFUSION BARRIER LAYER FOR CONDUCTIVE VIA TO DECREASE CONTACT RESI...

ONE-TIME-PROGRAMMABLE DEVICE STRUCTURE

SELF-ALIGNED INTERCONNECT STRUCTURE AND METHOD OF FORMING THE SAME

CONDUCTIVE STRUCTURE IN SEMICONDUCTOR STRUCTURE AND METHOD FOR FORM...

THERMAL SENSOR DEVICE BY BACK END OF LINE METAL RESISTOR

SELF-ALIGNED SCHEME FOR SEMICONDUCTOR DEVICE AND METHOD OF FORMING...

SELF-ALIGNED SCHEME FOR SEMICONDUCTOR DEVICE AND METHOD OF FORMING...

SEMICONDUCTOR DEVICE STRUCTURE WITH BARRIER LAYER AND METHOD FOR FO...

DIFFUSION BARRIER LAYER FOR CONDUCTIVE VIA TO DECREASE CONTACT RESI...

SEMICONDUCTOR DEVICE STRUCTURE WITH RESISTIVE ELEMENT

ONE-TIME-PROGRAMMABLE DEVICE STRUCTURE

BARRIER FREE INTERFACE BETWEEN BEOL INTERCONNECTS

METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE WITH RESISTIVE ELE...

Forming Interconnect Structures in Semiconductor Devices

Self-Aligned Interconnect Structure And Method Of Forming The Same

E-Fuse Enhancement By Underlayer Layout Design

INTER-WIRE CAVITY FOR LOW CAPACITANCE

Self-Aligned Scheme for Semiconductor Device and Method of Forming...

DIFFUSION BARRIER LAYER FOR CONDUCTIVE VIA TO DECREASE CONTACT RESI...

Self-Aligned Scheme for Semiconductor Device and Method of Forming...

SEMICONDUCTOR DEVICE STRUCTURE WITH RESISTIVE ELEMENT

BARRIER FREE INTERFACE BETWEEN BEOL INTERCONNECTS

INTER-WIRE CAVITY FOR LOW CAPACITANCE

DIFFUSION BARRIER LAYER FOR CONDUCTIVE VIA TO DECREASE CONTACT RESI...

SEMICONDUCTOR DEVICE STRUCTURE WITH RESISTIVE ELEMENTS

Self-Aligned Scheme for Semiconductor Device and Method of Forming...

E-Fuse Enhancement By Underlayer Layout Design

METHOD FOR FORMING SEMICONDUCTOR DEVICE WITH RESISTIVE ELEMENT

STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE WITH RESISTI...

STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE WITH RESISTI...