TREA

Hsu-Feng Hsueh

Follow

Person

  • Tainan City, TW
People

Patents Grantslast 30 patents

  • Information Patent Grant

    ADC calibration
    • Patent number 9,344,106
    • Issue date May 17, 2016
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    ADC calibration
    • Patent number 8,928,508
    • Issue date Jan 6, 2015
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Sigma delta modulator including digital to analog coverter (DAC) ca...
    • Patent number 8,803,715
    • Issue date Aug 12, 2014
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Apparatus and method for measuring degradation of CMOS VLSI elements
    • Patent number 8,692,571
    • Issue date Apr 8, 2014
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Fang-Shi Jordan Lai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Pipeline analog-to-digital converter
    • Patent number 8,493,259
    • Issue date Jul 23, 2013
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Switched-capacitor circuit with low signal degradation
    • Patent number 8,441,384
    • Issue date May 14, 2013
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    ADC calibration apparatus
    • Patent number 8,416,105
    • Issue date Apr 9, 2013
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Background calibration of analog-to-digital converters
    • Patent number 8,279,097
    • Issue date Oct 2, 2012
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Method and apparatus for analog to digital conversion
    • Patent number 8,279,102
    • Issue date Oct 2, 2012
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Method and apparatus for calibrating sigma-delta modulator
    • Patent number 8,228,221
    • Issue date Jul 24, 2012
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    ADC calibration
    • Patent number 8,223,047
    • Issue date Jul 17, 2012
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    DAC calibration
    • Patent number 8,134,486
    • Issue date Mar 13, 2012
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    DAC variation-tracking calibration
    • Patent number 7,893,853
    • Issue date Feb 22, 2011
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

  • Information Patent Application

    ADC CALIBRATION
    • Publication number 20150097710
    • Publication date Apr 9, 2015
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan LAI
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    PIPELINE ANALOG-TO-DIGITAL CONVERTER
    • Publication number 20130141260
    • Publication date Jun 6, 2013
    • Taiwan Semiconductor Manufacturing Co., LTD
    • Fang-Shi Jordan LAI
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    APPARATUS AND METHOD FOR MEASURING DEGRADATION OF CMOS VLSI ELEMENTS
    • Publication number 20130015876
    • Publication date Jan 17, 2013
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Fang-Shi Jordan LAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ADC CALIBRATION
    • Publication number 20120249351
    • Publication date Oct 4, 2012
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    SWITCHED-CAPACITOR CIRCUIT WITH LOW SIGNAL DEGRADATION
    • Publication number 20120212361
    • Publication date Aug 23, 2012
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    ADC Calibration Apparatus
    • Publication number 20120212359
    • Publication date Aug 23, 2012
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    DAC CALIBRATION
    • Publication number 20120133536
    • Publication date May 31, 2012
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan LAI
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    METHOD AND APPARATUS FOR ANALOG TO DIGITAL CONVERSION
    • Publication number 20120081244
    • Publication date Apr 5, 2012
    • Taiwan Semiconductor Manufacturing Co., LTD
    • Fang-Shi Jordan LAI
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    METHOD AND APPARATUS FOR CALIBRATING SIGMA-DELTA MODULATOR
    • Publication number 20120075132
    • Publication date Mar 29, 2012
    • Taiwan Semiconductor Manufacturing Co., LTD
    • Fang-Shi Jordan LAI
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    DAC CALIBRATION
    • Publication number 20110037631
    • Publication date Feb 17, 2011
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan LAI
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    ADC CALIBRATION
    • Publication number 20110037632
    • Publication date Feb 17, 2011
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Background Calibration of Analog-to-Digital Converters
    • Publication number 20110012763
    • Publication date Jan 20, 2011
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    DAC Variation-Tracking Calibration
    • Publication number 20100164766
    • Publication date Jul 1, 2010
    • Fang-Shi Jordan Lai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Bandgap Reference Circuits for Providing Accurate Sub-1V Voltages
    • Publication number 20090096509
    • Publication date Apr 16, 2009
    • Fang-Shi Jordan Lai
    • G05 - CONTROLLING REGULATING