Hsu-Jui Huang

Person

Taipei City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing a semiconductor device and apparatus for ma...
- Patent number 12,235,589
- Issue date Feb 25, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shinn-Sheng Yu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Test pattern generation systems and methods
- Patent number 12,039,247
- Issue date Jul 16, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Fu-An Tien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of mask data synthesis and mask making
- Patent number 11,947,254
- Issue date Apr 2, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsu-Ting Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing a semiconductor device and apparatus for ma...
- Patent number 11,709,435
- Issue date Jul 25, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shinn-Sheng Yu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Dual sensor imaging system and privacy protection imaging method th...
- Patent number 11,689,822
- Issue date Jun 27, 2023
- Altek Semiconductor Corp.
- Shih-Yuan Peng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithography simulation method
- Patent number 11,675,958
- Issue date Jun 13, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Fu An Tien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Photo mask data correction method
- Patent number 11,662,657
- Issue date May 30, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Fu An Tien
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Dual sensor imaging system and imaging method thereof
- Patent number 11,568,526
- Issue date Jan 31, 2023
- Altek Semiconductor Corp.
- Shih-Yuan Peng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dual sensor imaging system and imaging method thereof
- Patent number 11,496,694
- Issue date Nov 8, 2022
- Altek Semiconductor Corp.
- Shih-Yuan Peng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dual sensor imaging system and depth map calculation method thereof
- Patent number 11,496,660
- Issue date Nov 8, 2022
- Altek Semiconductor Corp.
- Shih-Yuan Peng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Photolithography method and apparatus
- Patent number 11,429,027
- Issue date Aug 30, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shinn-Sheng Yu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of mask data synthesis and mask making
- Patent number 11,415,890
- Issue date Aug 16, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsu-Ting Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Dual sensor imaging system and calibration method which includes a...
- Patent number 11,418,719
- Issue date Aug 16, 2022
- Altek Semiconductor Corp.
- Shih-Yuan Peng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Photo mask data correction method
- Patent number 11,360,379
- Issue date Jun 14, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Fu An Tien
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing a semiconductor device and apparatus for ma...
- Patent number 11,320,747
- Issue date May 3, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shinn-Sheng Yu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Importing and exporting circuit layouts
- Patent number 11,204,897
- Issue date Dec 21, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Fu An Tien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for mask data synthesis with wafer target adjustment
- Patent number 11,092,899
- Issue date Aug 17, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsu-Ting Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test pattern generation systems and methods
- Patent number 11,093,683
- Issue date Aug 17, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Fu-An Tien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithography simulation method
- Patent number 11,080,458
- Issue date Aug 3, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Fu An Tien
- G01 - MEASURING TESTING
Information Patent Grant
Lithography model calibration
- Patent number 11,061,318
- Issue date Jul 13, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Hsiang Lo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing method and electronic device capable of optimizing...
- Patent number 10,972,676
- Issue date Apr 6, 2021
- Altek Corporation
- Kai-Lin Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of mask simulation model for OPC and mask making
- Patent number 10,962,875
- Issue date Mar 30, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsu-Ting Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of mask data synthesis and mask making
- Patent number 10,942,443
- Issue date Mar 9, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsu-Ting Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods of making mask using transmission cross coefficient (TCC) m...
- Patent number 10,867,112
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsu-Ting Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask process correction
- Patent number 10,866,505
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsu-Ting Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Photo mask data correction method
- Patent number 10,866,506
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Fu An Tien
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing a semiconductor device and apparatus for ma...
- Patent number 10,866,525
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shinn-Sheng Yu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Image processing method and image processing device
- Patent number 10,630,911
- Issue date Apr 21, 2020
- Altek Corporation
- Hsu-Lien Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of mask simulation model for OPC and mask making
- Patent number 10,495,967
- Issue date Dec 3, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsu-Ting Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Source beam optimization method for improving lithography printability
- Patent number 10,417,376
- Issue date Sep 17, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsu-Ting Huang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TEST PATTERN GENERATION SYSTEMS AND METHODS
- Publication number 20240338510
- Publication date Oct 10, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Fu-An Tien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MANUFACTURING INTEGRATED CIRCUIT
- Publication number 20240201579
- Publication date Jun 20, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsu-Ting HUANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR MASK DATA SYNTHESIS WITH WAFER TARGET ADJUSTMENT
- Publication number 20240061344
- Publication date Feb 22, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsu-Ting HUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND APPARATUS FOR MA...
- Publication number 20230333486
- Publication date Oct 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shinn-Sheng YU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MASK DATA SYNTHESIS AND MASK MAKING
- Publication number 20220373878
- Publication date Nov 24, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsu-Ting HUANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PHOTOLITHOGRAPHY METHOD AND APPARATUS
- Publication number 20220365438
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shinn-Sheng YU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PHOTO MASK DATA CORRECTION METHOD
- Publication number 20220308439
- Publication date Sep 29, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fu An TIEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND APPARATUS FOR MA...
- Publication number 20220260931
- Publication date Aug 18, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shinn-Sheng YU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR MASK DATA SYNTHESIS WITH WAFER TARGET ADJUSTMENT
- Publication number 20210373443
- Publication date Dec 2, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsu-Ting HUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST PATTERN GENERATION SYSTEMS AND METHODS
- Publication number 20210365625
- Publication date Nov 25, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Fu-An Tien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LITHOGRAPHY SIMULATION METHOD
- Publication number 20210357571
- Publication date Nov 18, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Fu An TIEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUAL SENSOR IMAGING SYSTEM AND DEPTH MAP CALCULATION METHOD THEREOF
- Publication number 20210243344
- Publication date Aug 5, 2021
- Altek Semiconductor Corp.
- Shih-Yuan Peng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUAL SENSOR IMAGING SYSTEM AND IMAGING METHOD THEREOF
- Publication number 20210217153
- Publication date Jul 15, 2021
- Altek Semiconductor Corp.
- Shih-Yuan Peng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUAL SENSOR IMAGING SYSTEM AND PRIVACY PROTECTION IMAGING METHOD TH...
- Publication number 20210218871
- Publication date Jul 15, 2021
- Altek Semiconductor Corp.
- Shih-Yuan Peng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUAL SENSOR IMAGING SYSTEM AND IMAGING METHOD THEREOF
- Publication number 20210195087
- Publication date Jun 24, 2021
- Altek Semiconductor Corp.
- Shih-Yuan Peng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MASK DATA SYNTHESIS AND MASK MAKING
- Publication number 20210191254
- Publication date Jun 24, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsu-Ting HUANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DUAL SENSOR IMAGING SYSTEM AND CALIBRATION METHOD THEREOF
- Publication number 20210195082
- Publication date Jun 24, 2021
- Altek Semiconductor Corp.
- Shih-Yuan Peng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PHOTO MASK DATA CORRECTION METHOD
- Publication number 20210103211
- Publication date Apr 8, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Fu An TIEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND APPARATUS FOR MA...
- Publication number 20210096475
- Publication date Apr 1, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shinn-Sheng YU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LITHOGRAPHY MODEL CALIBRATION
- Publication number 20200278604
- Publication date Sep 3, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Hsiang LO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MASK DATA SYNTHESIS WITH WAFER TARGET ADJUSTMENT
- Publication number 20200174380
- Publication date Jun 4, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsu-Ting HUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMPORTING AND EXPORTING CIRCUIT LAYOUTS
- Publication number 20200133924
- Publication date Apr 30, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Fu An TIEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHOTO MASK DATA CORRECTION METHOD
- Publication number 20200133115
- Publication date Apr 30, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Fu An TIEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TEST PATTERN GENERATION SYSTEMS AND METHODS
- Publication number 20200134131
- Publication date Apr 30, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Fu-An Tien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LITHOGRAPHY SIMULATION METHOD
- Publication number 20200103764
- Publication date Apr 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Fu An TIEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Mask Simulation Model for OPC and Mask Making
- Publication number 20200103747
- Publication date Apr 2, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Hsu-Ting Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASK PROCESS CORRECTION
- Publication number 20200096857
- Publication date Mar 26, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsu-Ting HUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING METHOD AND IMAGE PROCESSING DEVICE
- Publication number 20200084362
- Publication date Mar 12, 2020
- ALTEK CORPORATION
- Hsu-Lien Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHOTOLITHOGRAPHY METHOD AND APPARATUS
- Publication number 20200057375
- Publication date Feb 20, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shinn-Sheng YU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND APPARATUS FOR MA...
- Publication number 20200041915
- Publication date Feb 6, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shinn-Sheng YU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Hsu-Jui Huang

Person

Patents Grantslast 30 patents

Method of manufacturing a semiconductor device and apparatus for ma...

Test pattern generation systems and methods

Method of mask data synthesis and mask making

Method of manufacturing a semiconductor device and apparatus for ma...

Dual sensor imaging system and privacy protection imaging method th...

Lithography simulation method

Photo mask data correction method

Dual sensor imaging system and imaging method thereof

Dual sensor imaging system and imaging method thereof

Dual sensor imaging system and depth map calculation method thereof

Photolithography method and apparatus

Method of mask data synthesis and mask making

Dual sensor imaging system and calibration method which includes a...

Photo mask data correction method

Method of manufacturing a semiconductor device and apparatus for ma...

Importing and exporting circuit layouts

Method for mask data synthesis with wafer target adjustment

Test pattern generation systems and methods

Lithography simulation method

Lithography model calibration

Image processing method and electronic device capable of optimizing...

Method of mask simulation model for OPC and mask making

Method of mask data synthesis and mask making

Methods of making mask using transmission cross coefficient (TCC) m...

Mask process correction

Photo mask data correction method

Method of manufacturing a semiconductor device and apparatus for ma...

Image processing method and image processing device

Method of mask simulation model for OPC and mask making

Source beam optimization method for improving lithography printability

Patents Applicationslast 30 patents

TEST PATTERN GENERATION SYSTEMS AND METHODS

METHOD OF MANUFACTURING INTEGRATED CIRCUIT

METHOD FOR MASK DATA SYNTHESIS WITH WAFER TARGET ADJUSTMENT

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND APPARATUS FOR MA...

METHOD OF MASK DATA SYNTHESIS AND MASK MAKING

PHOTOLITHOGRAPHY METHOD AND APPARATUS

PHOTO MASK DATA CORRECTION METHOD

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND APPARATUS FOR MA...

METHOD FOR MASK DATA SYNTHESIS WITH WAFER TARGET ADJUSTMENT

TEST PATTERN GENERATION SYSTEMS AND METHODS

LITHOGRAPHY SIMULATION METHOD

DUAL SENSOR IMAGING SYSTEM AND DEPTH MAP CALCULATION METHOD THEREOF

DUAL SENSOR IMAGING SYSTEM AND IMAGING METHOD THEREOF

DUAL SENSOR IMAGING SYSTEM AND PRIVACY PROTECTION IMAGING METHOD TH...

DUAL SENSOR IMAGING SYSTEM AND IMAGING METHOD THEREOF

METHOD OF MASK DATA SYNTHESIS AND MASK MAKING

DUAL SENSOR IMAGING SYSTEM AND CALIBRATION METHOD THEREOF

PHOTO MASK DATA CORRECTION METHOD

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND APPARATUS FOR MA...

LITHOGRAPHY MODEL CALIBRATION

METHOD FOR MASK DATA SYNTHESIS WITH WAFER TARGET ADJUSTMENT

IMPORTING AND EXPORTING CIRCUIT LAYOUTS

PHOTO MASK DATA CORRECTION METHOD

TEST PATTERN GENERATION SYSTEMS AND METHODS

LITHOGRAPHY SIMULATION METHOD

Method of Mask Simulation Model for OPC and Mask Making

MASK PROCESS CORRECTION

IMAGE PROCESSING METHOD AND IMAGE PROCESSING DEVICE

PHOTOLITHOGRAPHY METHOD AND APPARATUS

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND APPARATUS FOR MA...