Hsun-Tai Wei

Person

Taoyuan City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Probe card device and transmission structure
- Patent number 11,933,817
- Issue date Mar 19, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Split thin-film probe card
- Patent number 11,287,446
- Issue date Mar 29, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and fence-like probe thereof
- Patent number 11,226,354
- Issue date Jan 18, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and neck-like probe thereof
- Patent number 11,209,461
- Issue date Dec 28, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device
- Patent number 11,204,371
- Issue date Dec 21, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Thin-film probe card and test module thereof
- Patent number 11,175,313
- Issue date Nov 16, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD DEVICE AND TRANSMISSION STRUCTURE
- Publication number 20230033013
- Publication date Feb 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF
- Publication number 20220018876
- Publication date Jan 20, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND FAN-OUT PROBE THEREOF
- Publication number 20220011346
- Publication date Jan 13, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
THIN-FILM PROBE CARD AND TEST MODULE THEREOF
- Publication number 20210349129
- Publication date Nov 11, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
SPLIT THIN-FILM PROBE CARD AND ELASTIC MODULE THEREOF
- Publication number 20210325430
- Publication date Oct 21, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND DIRECTIVITY PROBE THEREOF
- Publication number 20210223291
- Publication date Jul 22, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND NECK-LIKE PROBE THEREOF
- Publication number 20210223289
- Publication date Jul 22, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING

Hsun-Tai Wei

Person

Patents Grantslast 30 patents

Probe card device and transmission structure

Split thin-film probe card

Probe card device and fence-like probe thereof

Probe card device and neck-like probe thereof

Probe card device

Thin-film probe card and test module thereof

Patents Applicationslast 30 patents

PROBE CARD DEVICE AND TRANSMISSION STRUCTURE

PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF

PROBE CARD DEVICE AND FAN-OUT PROBE THEREOF

THIN-FILM PROBE CARD AND TEST MODULE THEREOF

SPLIT THIN-FILM PROBE CARD AND ELASTIC MODULE THEREOF

PROBE CARD DEVICE AND DIRECTIVITY PROBE THEREOF

PROBE CARD DEVICE AND NECK-LIKE PROBE THEREOF