Hua Chu

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Saratoga, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for automatically de-skewing of multiple layer wafer for imp...
- Patent number 8,045,790
- Issue date Oct 25, 2011
- Nanometrics Incorporated
- Jian Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for automatic de-skewing of multiple layer wafer for improve...
- Patent number 7,433,509
- Issue date Oct 7, 2008
- Nanometrics Incorporated
- Jian Zhou
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Automatically De-Skewing of Multiple Layer Wafer for Imp...
- Publication number 20090010529
- Publication date Jan 8, 2009
- Nanometrics Incorporated
- Jian Zhou
- G06 - COMPUTING CALCULATING COUNTING