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Huabei Jiang
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West Lafayette, IN, US
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last 30 patents
Information
Patent Grant
Particle analysis system and method
Patent number
7,187,441
Issue date
Mar 6, 2007
The Texas A&M University System
Eva Sevick-Muraca
G01 - MEASURING TESTING
Information
Patent Grant
Enhanced photon-migration methods for particle sizing in concentrat...
Patent number
6,480,276
Issue date
Nov 12, 2002
Clemson University
Huabei Jiang
G01 - MEASURING TESTING
Information
Patent Grant
Particle analysis system and method
Patent number
5,818,583
Issue date
Oct 6, 1998
Purdue Research Foundation
Eva Sevick-Muraca
G01 - MEASURING TESTING