Huan-Chih Tsai

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Santa Barbara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for improving the test quality for scan-based BIS...
- Patent number 6,694,466
- Issue date Feb 17, 2004
- Agere Systems Inc.
- Huan-Chih Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Almost full-scan BIST method and system having higher fault coverag...
- Patent number 6,463,561
- Issue date Oct 8, 2002
- Agere Systems Guardian Corp.
- Sudipta Bhawmik
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid algorithm for test point selection for scan-based BIST
- Patent number 6,256,759
- Issue date Jul 3, 2001
- Agere Systems Inc.
- Sudipta Bhawmik
- G06 - COMPUTING CALCULATING COUNTING