Huangsheng Ding

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Suzhou, CN

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Patents Grantslast 30 patents

Information Patent Grant
Slave device alert signal in inter-integrated circuit (I2C) bus system
- Patent number 9,965,420
- Issue date May 8, 2018
- NXP USA, INC.
- Bingkun Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit with low power scan system
- Patent number 9,964,596
- Issue date May 8, 2018
- NXP USA, INC.
- Ling Wang
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced status monitor for scan testing
- Patent number 9,939,840
- Issue date Apr 10, 2018
- NXP USA, INC.
- Ling Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit for very low voltage and bias scan testing of integrat...
- Patent number 9,551,749
- Issue date Jan 24, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Wanggen Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with increased fault coverage
- Patent number 9,297,855
- Issue date Mar 29, 2016
- FREESCALE SEMIOCNDUCTOR,INC.
- Anurag Jindal
- G01 - MEASURING TESTING
Information Patent Grant
Reconfigurable circuit and decoder therefor
- Patent number 9,110,133
- Issue date Aug 18, 2015
- FREESCALE SEMICONDUCOTR, INC.
- Ling Wang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT WITH LOW POWER SCAN SYSTEM
- Publication number 20170146599
- Publication date May 25, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Ling Wang
- G01 - MEASURING TESTING
Information Patent Application
SLAVE DEVICE ALERT SIGNAL IN INTER-INTEGRATED CIRCUIT (I2C) BUS SYSTEM
- Publication number 20170109305
- Publication date Apr 20, 2017
- FREESCALE SEMICONDUCTOR, INC.
- BINGKUN LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED STATUS MONITOR FOR SCAN TESTING
- Publication number 20160238655
- Publication date Aug 18, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Ling Wang
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT FOR VERY LOW VOLTAGE AND BIAS SCAN TESTING OF INTEGRAT...
- Publication number 20160178695
- Publication date Jun 23, 2016
- FREESCALE SEMICONDUCTOR, INC.
- WANGGEN ZHANG
- G01 - MEASURING TESTING
Information Patent Application
RECONFIGURABLE CIRCUIT AND DECODER THEREFOR
- Publication number 20150048863
- Publication date Feb 19, 2015
- Ling Wang
- G01 - MEASURING TESTING