Huapeng Huang

Person

Latham, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Methods for forming superconductor articles and XRD methods for cha...
- Patent number 8,647,705
- Issue date Feb 11, 2014
- Superpower, Inc.
- Jodi Lynn Reeves
- C30 - CRYSTAL GROWTH
Information Patent Grant
X-ray diffraction apparatus and technique for measuring grain orien...
- Patent number 8,130,908
- Issue date Mar 6, 2012
- X-Ray Optical Systems, Inc.
- Huapeng Huang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for X-ray diffraction measurements using an align...
- Patent number 7,711,088
- Issue date May 4, 2010
- X-Ray Optical Systems, Inc.
- David M. Gibson
- G01 - MEASURING TESTING
Information Patent Grant
In-situ X-ray diffraction system using sources and detectors at fix...
- Patent number 7,236,566
- Issue date Jun 26, 2007
- David M. Gibson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR IN-SITU X-RAY DIFFRACTION-BASED REAL-TIME MON...
- Publication number 20230194445
- Publication date Jun 22, 2023
- ADVANCED ANALYZER LABS, INC.
- PETER ZAVALIJ
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR FORMING SUPERCONDUCTOR ARTICLES AND XRD METHODS FOR CHA...
- Publication number 20130150247
- Publication date Jun 13, 2013
- SuperPower. Inc.
- Jodi Lynn Reeves
- C30 - CRYSTAL GROWTH
Information Patent Application
X-RAY DIFFRACTION APPARATUS AND TECHNIQUE FOR MEASURING GRAIN ORIEN...
- Publication number 20110038457
- Publication date Feb 17, 2011
- X-Ray Optical Systems, Inc.
- Huapeng HUANG
- G01 - MEASURING TESTING
Information Patent Application
WIDE PARALLEL BEAM DIFFRACTION IMAGING METHOD AND SYSTEM
- Publication number 20080159479
- Publication date Jul 3, 2008
- X-Ray Optical Systems, Inc.
- Huapeng HUANG
- G01 - MEASURING TESTING
Information Patent Application
In-situ X-ray diffraction system using sources and detectors at fix...
- Publication number 20060140343
- Publication date Jun 29, 2006
- X-Ray Optical Systems, Inc.
- David M. Gibson
- G01 - MEASURING TESTING
Information Patent Application
Method and system for X-ray diffraction measurements using an align...
- Publication number 20050018809
- Publication date Jan 27, 2005
- X-Ray Optical Systems, Inc.
- David M. Gibson
- G01 - MEASURING TESTING
Information Patent Application
Methods for forming superconductor articles and XRD methods for cha...
- Publication number 20050014653
- Publication date Jan 20, 2005
- SuperPower, Inc.
- Jodi Lynn Reeves
- C30 - CRYSTAL GROWTH

Huapeng Huang

Person

Patents Grantslast 30 patents

System and method for in-situ X-ray diffraction-based real-time mon...

Methods for forming superconductor articles and XRD methods for cha...

X-ray diffraction apparatus and technique for measuring grain orien...

Method and system for X-ray diffraction measurements using an align...

In-situ X-ray diffraction system using sources and detectors at fix...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR IN-SITU X-RAY DIFFRACTION-BASED REAL-TIME MON...

METHODS FOR FORMING SUPERCONDUCTOR ARTICLES AND XRD METHODS FOR CHA...

X-RAY DIFFRACTION APPARATUS AND TECHNIQUE FOR MEASURING GRAIN ORIEN...

WIDE PARALLEL BEAM DIFFRACTION IMAGING METHOD AND SYSTEM

In-situ X-ray diffraction system using sources and detectors at fix...

Method and system for X-ray diffraction measurements using an align...

Methods for forming superconductor articles and XRD methods for cha...