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Huatang Wu
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Scarborough, CA
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last 30 patents
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Patent Grant
Automated analyzer using light diffraction
Patent number
8,076,128
Issue date
Dec 13, 2011
Axela Inc.
Adam Liederman
G01 - MEASURING TESTING
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last 30 patents
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Automated analyzer using light diffraction
Publication number
20070264707
Publication date
Nov 15, 2007
Adam Liederman
G01 - MEASURING TESTING