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Huaxing Tang
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Wilsonville, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Machine learning-based adjustments in volume diagnosis procedures f...
Patent number
12,001,973
Issue date
Jun 4, 2024
SIEMENS INDUSTRY SOFTWARE INC.
Gaurav Veda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Physical failure analysis-oriented diagnosis resolution prediction
Patent number
11,227,091
Issue date
Jan 18, 2022
SIEMENS INDUSTRY SOFTWARE INC.
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Diagnosis resolution prediction
Patent number
11,042,679
Issue date
Jun 22, 2021
SIEMENS INDUSTRY SOFTWARE INC.
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Cell-aware diagnostic pattern generation for logic diagnosis
Patent number
10,795,751
Issue date
Oct 6, 2020
Mentor Graphics Corporation
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inter-cell bridge defect diagnosis
Patent number
10,657,207
Issue date
May 19, 2020
Mentor Graphics Corporation
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Cell-aware root cause deconvolution for defect diagnosis and yield...
Patent number
10,592,625
Issue date
Mar 17, 2020
Mentor Graphics Corporation
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Circuit defect diagnosis based on sink cell fault models
Patent number
10,234,502
Issue date
Mar 19, 2019
Mentor Graphics Corporation
Huaxing Tang
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic design partitioning for diagnosis
Patent number
9,857,421
Issue date
Jan 2, 2018
Mentor Graphics Corporation
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dynamic design partitioning for diagnosis
Patent number
9,336,107
Issue date
May 10, 2016
Mentor Graphics Corporation
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dynamic design partitioning for scan chain diagnosis
Patent number
9,244,125
Issue date
Jan 26, 2016
Mentor Graphics Corporation
Yu Huang
G01 - MEASURING TESTING
Information
Patent Grant
Speeding up defect diagnosis techniques
Patent number
8,812,922
Issue date
Aug 19, 2014
Mentor Graphics Corporation
Wei Zou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Fault diagnosis based on design partitioning
Patent number
8,707,232
Issue date
Apr 22, 2014
Mentor Graphics Corporation
Huaxing Tang
G01 - MEASURING TESTING
Information
Patent Grant
Generating test patterns having enhanced coverage of untargeted def...
Patent number
8,201,131
Issue date
Jun 12, 2012
Mentor Graphics Corporation
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Grant
Fault dictionaries for integrated circuit yield and quality analysi...
Patent number
7,987,442
Issue date
Jul 26, 2011
Mentor Graphics Corporation
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Grant
Determining and analyzing integrated circuit yield and quality
Patent number
7,512,508
Issue date
Mar 31, 2009
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Generating test patterns having enhanced coverage of untargeted def...
Patent number
7,509,600
Issue date
Mar 24, 2009
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
MACHINE LEARNING-BASED ADJUSTMENTS IN VOLUME DIAGNOSIS PROCEDURES F...
Publication number
20200302321
Publication date
Sep 24, 2020
Mentor Graphics Corporation
Gaurav Veda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Cell-Aware Diagnostic Pattern Generation For Logic Diagnosis
Publication number
20180253346
Publication date
Sep 6, 2018
Mentor Graphics Corporation
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Counter-Based Scan Chain Diagnosis
Publication number
20180217204
Publication date
Aug 2, 2018
Mentor Graphics Corporation
Yu Huang
G11 - INFORMATION STORAGE
Information
Patent Application
DYNAMIC DESIGN PARTITIONING FOR DIAGNOSIS
Publication number
20160245866
Publication date
Aug 25, 2016
Mentor Graphics Corporation
Huaxing Tang
G01 - MEASURING TESTING
Information
Patent Application
Cell Internal Defect Diagnosis
Publication number
20150234978
Publication date
Aug 20, 2015
Mentor Graphics Corporation
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPEEDING UP DEFECT DIAGNOSIS TECHNIQUES
Publication number
20150135030
Publication date
May 14, 2015
Mentor Graphics Corporation
Wei Zou
G01 - MEASURING TESTING
Information
Patent Application
Dynamic Design Partitioning For Scan Chain Diagnosis
Publication number
20140164859
Publication date
Jun 12, 2014
Mentor Graphics Corporation
Yu Huang
G01 - MEASURING TESTING
Information
Patent Application
Dynamic Design Partitioning For Diagnosis
Publication number
20130145213
Publication date
Jun 6, 2013
Mentor Graphics Corporation
Huaxing Tang
G01 - MEASURING TESTING
Information
Patent Application
Fault Diagnosis Based On Design Partitioning
Publication number
20130024830
Publication date
Jan 24, 2013
Huaxing Tang
G01 - MEASURING TESTING
Information
Patent Application
Increased Fault Diagnosis Throughput Using Dictionaries For Hyperac...
Publication number
20090287438
Publication date
Nov 19, 2009
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETERMINING AND ANALYZING INTEGRATED CIRCUIT YIELD AND QUALITY
Publication number
20090210183
Publication date
Aug 20, 2009
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
GENERATING TEST PATTERNS HAVING ENHANCED COVERAGE OF UNTARGETED DEF...
Publication number
20090183128
Publication date
Jul 16, 2009
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPEEDING UP DEFECT DIAGNOSIS TECHNIQUES
Publication number
20070226570
Publication date
Sep 27, 2007
Wei Zou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Determining and analyzing integrated circuit yield and quality
Publication number
20060066339
Publication date
Mar 30, 2006
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Fault dictionaries for integrated circuit yield and quality analysi...
Publication number
20060066338
Publication date
Mar 30, 2006
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Integrated circuit yield and quality analysis methods and systems
Publication number
20060053357
Publication date
Mar 9, 2006
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Generating test patterns having enhanced coverage of untargeted def...
Publication number
20050240887
Publication date
Oct 27, 2005
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING