Hubert Kuderer

Person

Waldbronn, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-path flow cell correction
- Patent number 7,847,944
- Issue date Dec 7, 2010
- Agilent Technologies, Inc.
- Christian Buettner
- G01 - MEASURING TESTING
Information Patent Grant
Procedure for processing measuring data and device to perform the p...
- Patent number 7,117,109
- Issue date Oct 3, 2006
- Agilent Technologies, Inc.
- Hubert Kuderer
- G01 - MEASURING TESTING
Information Patent Grant
Method of reducing the effects of varying environmental conditions...
- Patent number 6,788,402
- Issue date Sep 7, 2004
- Agilent Technologies, Inc.
- Hubert Kuderer
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for testing a photosensor
- Patent number 6,608,293
- Issue date Aug 19, 2003
- Agilent Technologies Inc.
- Hubert Kuderer
- G01 - MEASURING TESTING
Information Patent Grant
Charge balance type photodiode array comprising a compensation circuit
- Patent number 6,326,603
- Issue date Dec 4, 2001
- Agilent Technologies, Inc.
- Hubert Kuderer
- G01 - MEASURING TESTING
Information Patent Grant
Photodiode array with expanded dynamic range
- Patent number 6,300,613
- Issue date Oct 9, 2001
- Agilent Technologies, Inc.
- Hubert Kuderer
- G01 - MEASURING TESTING
Information Patent Grant
Photodiode array having a controllable dumping circuitry
- Patent number 6,194,703
- Issue date Feb 27, 2001
- Hewlett-Packard Company
- Hubert Kuderer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Photodiode array
- Patent number 5,303,027
- Issue date Apr 12, 1994
- Hewlett-Packard Company
- Hubert Kuderer
- G01 - MEASURING TESTING
Information Patent Grant
Method for operating a photodiode array spectrometer and photodiode...
- Patent number 5,116,123
- Issue date May 26, 1992
- Hewlett-Packard Company
- Hubert Kuderer
- G01 - MEASURING TESTING
Information Patent Grant
Photodiode array spectrometer
- Patent number 4,958,928
- Issue date Sep 25, 1990
- Hewlett-Packard Company
- Hubert Kuderer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-WAVELENGTH LIGHT SOURCE
- Publication number 20160363568
- Publication date Dec 15, 2016
- Agilent Technologies, Inc.
- Kevin P. Killeen
- G01 - MEASURING TESTING
Information Patent Application
EXPANDED LINEAR RANGE BY USE OF TWO FLOW CELL DETECTORS WITH LONG A...
- Publication number 20140095082
- Publication date Apr 3, 2014
- Agilent Technologies, Inc.
- Hubert Kuderer
- G01 - MEASURING TESTING
Information Patent Application
MULTI-WAVELENGTH LIGHT SOURCE
- Publication number 20110132077
- Publication date Jun 9, 2011
- Agilent Technologies, Inc.
- Kevin P. Killeen
- G01 - MEASURING TESTING
Information Patent Application
Multi-path flow cell correction
- Publication number 20080079942
- Publication date Apr 3, 2008
- Christian Buettner
- G01 - MEASURING TESTING
Information Patent Application
Procedure for processing measuring data and device to perform the p...
- Publication number 20030158716
- Publication date Aug 21, 2003
- AGILENT TECHNOLOGIES, INC.
- Hubert Kuderer
- G01 - MEASURING TESTING
Information Patent Application
Method of reducing the effects of varying environmental conditions...
- Publication number 20020011097
- Publication date Jan 31, 2002
- Hubert Kuderer
- G01 - MEASURING TESTING
Information Patent Application
Device and method to provide quality control for a photosensor
- Publication number 20010013572
- Publication date Aug 16, 2001
- Hubert Kuderer
- G01 - MEASURING TESTING
Information Patent Application
Photodetector and a method to manufacture it
- Publication number 20010008287
- Publication date Jul 19, 2001
- AGILENT TECHNOLOGIES, INC.
- Karsten Kraiczek
- G01 - MEASURING TESTING

Hubert Kuderer

Person

Patents Grantslast 30 patents

Multi-path flow cell correction

Procedure for processing measuring data and device to perform the p...

Method of reducing the effects of varying environmental conditions...

Method of and apparatus for testing a photosensor

Charge balance type photodiode array comprising a compensation circuit

Photodiode array with expanded dynamic range

Photodiode array having a controllable dumping circuitry

Photodiode array

Method for operating a photodiode array spectrometer and photodiode...

Photodiode array spectrometer

Patents Applicationslast 30 patents

MULTI-WAVELENGTH LIGHT SOURCE

EXPANDED LINEAR RANGE BY USE OF TWO FLOW CELL DETECTORS WITH LONG A...

MULTI-WAVELENGTH LIGHT SOURCE

Multi-path flow cell correction

Procedure for processing measuring data and device to perform the p...

Method of reducing the effects of varying environmental conditions...

Device and method to provide quality control for a photosensor

Photodetector and a method to manufacture it