Hubertus Gerardus Hendrikus Vermeulen

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic test pattern generation
- Patent number 7,475,317
- Issue date Jan 6, 2009
- Koninklijke Philips Electronics N.V.
- Erik Jan Marinissen
- G01 - MEASURING TESTING
Information Patent Grant
Testing of circuit with plural clock domains
- Patent number 7,076,709
- Issue date Jul 11, 2006
- Koninklijke Philips Electronics N.V.
- Hubertus Gerardus Hendrikus Vermeulen
- G01 - MEASURING TESTING
Information Patent Grant
Test arrangement for assemblages of intergrated circuit blocks
- Patent number 6,988,230
- Issue date Jan 17, 2006
- Koninklijke Philips Electronics N.V.
- Hubertus Gerardus Hendrikus Vermeulen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FULL DUPLEX COMMUNICATION CIRCUIT AND METHOD THEREFOR
- Publication number 20120250587
- Publication date Oct 4, 2012
- Sujan Pandey
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SORTING CIRCUIT AND METHOD
- Publication number 20120054207
- Publication date Mar 1, 2012
- NXP B.V.
- Hubertus Gerardus Hendrikus Vermeulen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NETWORK MODE SWITCHING METHOD AND SERIAL DATA COMMUNICATION NETWORK
- Publication number 20110194458
- Publication date Aug 11, 2011
- NXP B.V.
- Andre Krijn NIEUWLAND
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DATA PROCESSING SYSTEM COMPRISING A MONITOR
- Publication number 20110179316
- Publication date Jul 21, 2011
- Marc Jeroen Geuzebroek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING OF AN INTEGRATED CIRCUIT THAT CONTAINS SECRET INFORMATION
- Publication number 20100264932
- Publication date Oct 21, 2010
- NXP B.V.
- Erik Jan Marinissen
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF AN INTEGRATED CIRCUIT THAT CONTAINS SECRET INFORMATION
- Publication number 20100223515
- Publication date Sep 2, 2010
- NXP B.V.
- Andre Krijn Nieuwland
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND METHOD OF CONTROLLING A COMMUNICATION
- Publication number 20100169896
- Publication date Jul 1, 2010
- Koninklijke Philips Electronics N.V.
- Martinus Theodorus Bennebroek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Testing of circuit with plural clock domains
- Publication number 20050076278
- Publication date Apr 7, 2005
- Hubertus Gerardus Hendrikus Vermeulen
- G01 - MEASURING TESTING

Hubertus Gerardus Hendrikus Vermeulen

Person

Patents Grantslast 30 patents

Automatic test pattern generation

Testing of circuit with plural clock domains

Test arrangement for assemblages of intergrated circuit blocks

Patents Applicationslast 30 patents

FULL DUPLEX COMMUNICATION CIRCUIT AND METHOD THEREFOR

SORTING CIRCUIT AND METHOD

NETWORK MODE SWITCHING METHOD AND SERIAL DATA COMMUNICATION NETWORK

DATA PROCESSING SYSTEM COMPRISING A MONITOR

TESTING OF AN INTEGRATED CIRCUIT THAT CONTAINS SECRET INFORMATION

TESTING OF AN INTEGRATED CIRCUIT THAT CONTAINS SECRET INFORMATION

ELECTRONIC DEVICE AND METHOD OF CONTROLLING A COMMUNICATION

Testing of circuit with plural clock domains