Hubertus Johannes Gertrudus Simons

Person

DH Venlo, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection method and apparatus and lithographic processing cell
- Patent number RE49460
- Issue date Mar 14, 2023
- ASML Netherlands B.V.
- Everhardus Cornelis Mos
Information Patent Grant
Inspection method and apparatus and lithographic processing cell
- Patent number RE49199
- Issue date Sep 6, 2022
- ASML Netherlands B.V.
- Everhardus Cornelis Mos
Information Patent Grant
Method and apparatus for inspection and metrology
- Patent number 11,170,072
- Issue date Nov 9, 2021
- ASML Netherands B.V.
- Everhardus Cornelis Mos
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device manufacturing method
- Patent number 11,061,336
- Issue date Jul 13, 2021
- ASML Netherlands B.V.
- Hubertus Johannes Gertrudus Simons
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection method and apparatus, and lithographic apparatus
- Patent number 9,927,717
- Issue date Mar 27, 2018
- ASML Netherlands B.V.
- Kyu Kab Rhe
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of applying a pattern to a substrate, device manufacturing m...
- Patent number 9,291,916
- Issue date Mar 22, 2016
- ASML Netherlands B.V.
- Stefan Cornelis Theodorus Van Der Sanden
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment mark deformation estimating method, substrate position pr...
- Patent number 8,982,347
- Issue date Mar 17, 2015
- ASML Netherlands B.V.
- Xiuhong Wei
- G01 - MEASURING TESTING
Information Patent Grant
Method of applying a pattern to a substrate, device manufacturing m...
- Patent number 8,976,355
- Issue date Mar 10, 2015
- ASML Netherlands B.V.
- Stefan Cornelis Theodorus Van Der Sanden
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection method and apparatus and lithographic processing cell
- Patent number 8,887,107
- Issue date Nov 11, 2014
- ASML Netherlands B.V.
- Everhardus Cornelis Mos
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Alignment system, lithographic system and method
- Patent number 8,706,442
- Issue date Apr 22, 2014
- ASML Netherlands B.V.
- Everhardus Cornelis Mos
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for selecting sample positions on a substrate, method for pr...
- Patent number 8,504,333
- Issue date Aug 6, 2013
- ASML Netherlands B.V.
- Everhardus Cornelis Mos
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
- Publication number 20220027437
- Publication date Jan 27, 2022
- ASML NETHERLANDS B.V.
- Everhardus Cornelis MOS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE MANUFACTURING METHOD
- Publication number 20200081353
- Publication date Mar 12, 2020
- ASML NETHERLANDS B.V.
- Hubertus Johannes Gertrudus SIMONS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
- Publication number 20180067900
- Publication date Mar 8, 2018
- ASML NETHERLANDS B.V.
- Everhardus Cornelis MOS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD AND APPARATUS, AND LITHOGRAPHIC APPARATUS
- Publication number 20160327870
- Publication date Nov 10, 2016
- ASML NETHERLANDS B.V.
- Kyu Kab RHE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Applying a Pattern to a Substrate, Device Manufacturing M...
- Publication number 20150153656
- Publication date Jun 4, 2015
- ASML NETHERLANDS B.V.
- Stefan Cornelis Theodorus VAN DER SANDEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection Method and Apparatus and Lithographic Processing Cell
- Publication number 20140089870
- Publication date Mar 27, 2014
- ASML NETHERLANDS B.V.
- Everhardus Cornelis MOS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Applying a Pattern to a Substrate, Device Manufacturing M...
- Publication number 20130230797
- Publication date Sep 5, 2013
- ASML NETHERLANDS B.V.
- Stefan Cornelis Theodorus VAN DER SANDEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment Mark Deformation Estimating Method, Substrate Position Pr...
- Publication number 20130141723
- Publication date Jun 6, 2013
- ASML Netherlands N.V.
- Xiuhong WEI
- G01 - MEASURING TESTING
Information Patent Application
Alignment systems and methods for lithographic systems
- Publication number 20060081792
- Publication date Apr 20, 2006
- ASML NETHERLANDS B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment system and method and device manufactured thereby
- Publication number 20050254030
- Publication date Nov 17, 2005
- ASML NETHERLANDS B.V.
- Hoite Pieter Theodoor Tolsma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment systems and methods for lithographic systems
- Publication number 20050189502
- Publication date Sep 1, 2005
- ASML NETHERLANDS B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Hubertus Johannes Gertrudus Simons

Person

Patents Grantslast 30 patents

Inspection method and apparatus and lithographic processing cell

Inspection method and apparatus and lithographic processing cell

Method and apparatus for inspection and metrology

Device manufacturing method

Inspection method and apparatus, and lithographic apparatus

Method of applying a pattern to a substrate, device manufacturing m...

Alignment mark deformation estimating method, substrate position pr...

Method of applying a pattern to a substrate, device manufacturing m...

Inspection method and apparatus and lithographic processing cell

Alignment system, lithographic system and method

Method for selecting sample positions on a substrate, method for pr...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR INSPECTION AND METROLOGY

DEVICE MANUFACTURING METHOD

METHOD AND APPARATUS FOR INSPECTION AND METROLOGY

INSPECTION METHOD AND APPARATUS, AND LITHOGRAPHIC APPARATUS

Method of Applying a Pattern to a Substrate, Device Manufacturing M...

Inspection Method and Apparatus and Lithographic Processing Cell

Method of Applying a Pattern to a Substrate, Device Manufacturing M...

Alignment Mark Deformation Estimating Method, Substrate Position Pr...

Alignment systems and methods for lithographic systems

Alignment system and method and device manufactured thereby

Alignment systems and methods for lithographic systems