Hucheng Lee

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Print check repeater defect detection
- Patent number 12,190,498
- Issue date Jan 7, 2025
- KLA Corp.
- Nurmohammed Patwary
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image contrast metrics for deriving and improving imaging conditions
- Patent number 12,056,867
- Issue date Aug 6, 2024
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design-assisted inspection for DRAM and 3D NAND devices
- Patent number 11,783,470
- Issue date Oct 10, 2023
- KLA Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selecting defect detection methods for inspection of a specimen
- Patent number 11,619,592
- Issue date Apr 4, 2023
- KLA Corp.
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Clustering sub-care areas based on noise characteristics
- Patent number 11,615,993
- Issue date Mar 28, 2023
- KLA Corporation
- Boshi Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controlling a process for inspection of a specimen
- Patent number 11,416,982
- Issue date Aug 16, 2022
- KLA Corp.
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design-assisted inspection for DRAM and 3D NAND devices
- Patent number 11,308,606
- Issue date Apr 19, 2022
- KLA Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for correlating optical images with scanning elec...
- Patent number 11,244,442
- Issue date Feb 8, 2022
- KLA Corporation
- Hucheng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect-location determination using correction loop for pixel align...
- Patent number 11,049,745
- Issue date Jun 29, 2021
- KLA Corporation
- David Dowling
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical-mode selection for multi-mode semiconductor inspection
- Patent number 11,010,885
- Issue date May 18, 2021
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects in a logic region on a wafer
- Patent number 10,923,317
- Issue date Feb 16, 2021
- KLA Corp.
- Junqing Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Visual feedback for inspection algorithms and filters
- Patent number 10,599,944
- Issue date Mar 24, 2020
- KLA-Tencor Corporation
- Hucheng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Capture of repeater defects on a semiconductor wafer
- Patent number 10,557,802
- Issue date Feb 11, 2020
- KLA-Tencor Corporation
- Bjorn Brauer
- G01 - MEASURING TESTING
Information Patent Grant
Automatic recipe stability monitoring and reporting
- Patent number 10,514,685
- Issue date Dec 24, 2019
- KLA-Tencor Corp.
- Hucheng Lee
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for correlating optical images with scanning elec...
- Patent number 10,410,338
- Issue date Sep 10, 2019
- KLA-Tencor Corporation
- Hucheng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intra-die defect detection
- Patent number 10,393,671
- Issue date Aug 27, 2019
- KLA-Tencor Corp.
- Govindarajan Thattaisundaram
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive local threshold and color filtering
- Patent number 10,395,359
- Issue date Aug 27, 2019
- KLA-Tencor Corp.
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High sensitivity repeater defect detection
- Patent number 10,395,358
- Issue date Aug 27, 2019
- KLA-Tencor Corp.
- Bjorn Brauer
- G01 - MEASURING TESTING
Information Patent Grant
System and method for defining care areas in repeating structures o...
- Patent number 10,339,262
- Issue date Jul 2, 2019
- KLA-Tencor Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods of using z-layer context in logic and hot spot...
- Patent number 10,304,177
- Issue date May 28, 2019
- KLA-Tencor Corporation
- Pavan Kumar Perali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining a position of a defect in an electron beam image
- Patent number 10,211,025
- Issue date Feb 19, 2019
- KLA-Tencor Corp.
- Hucheng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection for specimens with extensive die to die process variation
- Patent number 10,151,706
- Issue date Dec 11, 2018
- KLA-Tencor Corp.
- Santosh Bhattacharyya
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection using structural information
- Patent number 9,727,047
- Issue date Aug 8, 2017
- KLA-Tencor Corp.
- Qing Luo
- G05 - CONTROLLING REGULATING
Information Patent Grant
Adaptive local threshold and color filtering
- Patent number 9,704,234
- Issue date Jul 11, 2017
- KLA-Tencor Corp.
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERN SEGMENTATION FOR NUISANCE SUPPRESSION
- Publication number 20240221141
- Publication date Jul 4, 2024
- KLA Corporation
- Hsiao-Min Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PRINT CHECK REPEATER DEFECT DETECTION
- Publication number 20240177294
- Publication date May 30, 2024
- KLA Corporation
- Nurmohammed Patwary
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE CONTRAST METRICS FOR DERIVING AND IMPROVING IMAGING CONDITIONS
- Publication number 20220405903
- Publication date Dec 22, 2022
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN-ASSISTED INSPECTION FOR DRAM AND 3D NAND DEVICES
- Publication number 20220245791
- Publication date Aug 4, 2022
- KLA Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Clustering Sub-Care Areas Based on Noise Characteristics
- Publication number 20210159127
- Publication date May 27, 2021
- KLA Corporation
- Boshi Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLING A PROCESS FOR INSPECTION OF A SPECIMEN
- Publication number 20210097666
- Publication date Apr 1, 2021
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN-ASSISTED INSPECTION FOR DRAM AND 3D NAND DEVICES
- Publication number 20210049755
- Publication date Feb 18, 2021
- KLA Corporation
- Junqing Huang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SELECTING DEFECT DETECTION METHODS FOR INSP...
- Publication number 20210010945
- Publication date Jan 14, 2021
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical-Mode Selection for Multi-Mode Semiconductor Inspection
- Publication number 20200193588
- Publication date Jun 18, 2020
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect-Location Determination Using Correction Loop for Pixel Align...
- Publication number 20200126830
- Publication date Apr 23, 2020
- KLA-Tencor Corporation
- David Dowling
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING DEFECTS IN A LOGIC REGION ON A WAFER
- Publication number 20200090904
- Publication date Mar 19, 2020
- KLA Corporation
- Junqing Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Capture of Repeater Defects on a Semiconductor Wafer
- Publication number 20190346376
- Publication date Nov 14, 2019
- KLA-Tencor Corporation
- Bjorn Brauer
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Correlating Optical Images with Scanning Elec...
- Publication number 20190333206
- Publication date Oct 31, 2019
- KLA-Tencor Corporation
- Hucheng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH SENSITIVITY REPEATER DEFECT DETECTION
- Publication number 20180130199
- Publication date May 10, 2018
- KLA-Tencor Corporation
- Bjorn Brauer
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods of using z-layer context in logic and hot spot...
- Publication number 20180005367
- Publication date Jan 4, 2018
- KLA-Tencor Corporation
- Pavan Kumar Perali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Defining Care Areas in Repeating Structures o...
- Publication number 20170286589
- Publication date Oct 5, 2017
- KLA-Tencor Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Adaptive Local Threshold and Color Filtering
- Publication number 20170287128
- Publication date Oct 5, 2017
- KLA-Tencor Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Determining a Position of a Defect in an Electron Beam Image
- Publication number 20170047195
- Publication date Feb 16, 2017
- KLA-Tencor Corporation
- Hucheng Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Intra-Die Defect Detection
- Publication number 20160321800
- Publication date Nov 3, 2016
- KLA-Tencor Corporation
- Govindarajan Thattaisundaram
- G01 - MEASURING TESTING
Information Patent Application
Visual Feedback for Inspection Algorithms and Filters
- Publication number 20160210526
- Publication date Jul 21, 2016
- KLA-Tencor Corporation
- Hucheng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Detection Using Structural Information
- Publication number 20160104600
- Publication date Apr 14, 2016
- KLA-Tencor Corporation
- Qing Luo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automatic Recipe Stability Monitoring and Reporting
- Publication number 20150362908
- Publication date Dec 17, 2015
- KLA-Tencor Corporation
- Hucheng Lee
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and System for Correlating Optical Images with Scanning Elec...
- Publication number 20150125065
- Publication date May 7, 2015
- KLA-Tencor Corporation
- Hucheng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Adaptive Local Threshold and Color Filtering
- Publication number 20150043804
- Publication date Feb 12, 2015
- KLA-Tencor Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING

Hucheng Lee

Person

Patents Grantslast 30 patents

Print check repeater defect detection

Image contrast metrics for deriving and improving imaging conditions

Design-assisted inspection for DRAM and 3D NAND devices

Selecting defect detection methods for inspection of a specimen

Clustering sub-care areas based on noise characteristics

Controlling a process for inspection of a specimen

Design-assisted inspection for DRAM and 3D NAND devices

Method and system for correlating optical images with scanning elec...

Defect-location determination using correction loop for pixel align...

Optical-mode selection for multi-mode semiconductor inspection

Detecting defects in a logic region on a wafer

Visual feedback for inspection algorithms and filters

Capture of repeater defects on a semiconductor wafer

Automatic recipe stability monitoring and reporting

Method and system for correlating optical images with scanning elec...

Intra-die defect detection

Adaptive local threshold and color filtering

High sensitivity repeater defect detection

System and method for defining care areas in repeating structures o...

Systems and methods of using z-layer context in logic and hot spot...

Determining a position of a defect in an electron beam image

Inspection for specimens with extensive die to die process variation

Defect detection using structural information

Adaptive local threshold and color filtering

Patents Applicationslast 30 patents

PATTERN SEGMENTATION FOR NUISANCE SUPPRESSION

PRINT CHECK REPEATER DEFECT DETECTION

IMAGE CONTRAST METRICS FOR DERIVING AND IMPROVING IMAGING CONDITIONS

DESIGN-ASSISTED INSPECTION FOR DRAM AND 3D NAND DEVICES

Clustering Sub-Care Areas Based on Noise Characteristics

CONTROLLING A PROCESS FOR INSPECTION OF A SPECIMEN

DESIGN-ASSISTED INSPECTION FOR DRAM AND 3D NAND DEVICES

SYSTEMS AND METHODS FOR SELECTING DEFECT DETECTION METHODS FOR INSP...

Optical-Mode Selection for Multi-Mode Semiconductor Inspection

Defect-Location Determination Using Correction Loop for Pixel Align...

DETECTING DEFECTS IN A LOGIC REGION ON A WAFER

Capture of Repeater Defects on a Semiconductor Wafer

Method and System for Correlating Optical Images with Scanning Elec...

HIGH SENSITIVITY REPEATER DEFECT DETECTION

Systems and methods of using z-layer context in logic and hot spot...

System and Method for Defining Care Areas in Repeating Structures o...

Adaptive Local Threshold and Color Filtering

Determining a Position of a Defect in an Electron Beam Image

Intra-Die Defect Detection

Visual Feedback for Inspection Algorithms and Filters

Defect Detection Using Structural Information

Automatic Recipe Stability Monitoring and Reporting

Method and System for Correlating Optical Images with Scanning Elec...

Adaptive Local Threshold and Color Filtering