Huddee Ho

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope apparatus for use in a scanning electron...
- Patent number 5,510,615
- Issue date Apr 23, 1996
- TopoMetrix Corporation
- Huddee Ho
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope apparatus for use in a scanning electron
- Patent number 5,455,420
- Issue date Oct 3, 1995
- Topometrix
- Huddee Ho
- B82 - NANO-TECHNOLOGY