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Huei-Li Chen
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New Taipei City, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Controlling circuit for analog measurement module and controlling m...
Patent number
8,847,654
Issue date
Sep 30, 2014
Princeton Technology Corporation
Yang-Han Lee
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for biological monitoring
Patent number
8,823,511
Issue date
Sep 2, 2014
BroadMaster Biotech Corp.
Jen-Chien Chien
G08 - SIGNALLING
Information
Patent Grant
Logic tester and method for simultaneously measuring delay periods...
Patent number
8,099,659
Issue date
Jan 17, 2012
Princeton Technology Corporation
Yung-Yu Wu
G01 - MEASURING TESTING
Information
Patent Grant
Testing apparatus with high efficiency and high accuracy
Patent number
8,044,675
Issue date
Oct 25, 2011
Princeton Technology Corporation
Yung-Yu Wu
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Testing circuit board for testing devices under test
Patent number
7,830,163
Issue date
Nov 9, 2010
Princeton Technology Corporation
Cheng-Yung Teng
G01 - MEASURING TESTING
Information
Patent Grant
Circuit testing apparatus
Patent number
7,706,999
Issue date
Apr 27, 2010
Princeton Technology Corporation
Cheng-Yung Teng
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATIC TESTING SYSTEM AND METHOD
Publication number
20150153405
Publication date
Jun 4, 2015
PRINCETON TECHNOLOGY CORPORATION
Yung-Yu WU
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR BIOLOGICAL MONITORING
Publication number
20130300559
Publication date
Nov 14, 2013
BroadMaster Biotech Corp.
Jen-Chien Chien
G08 - SIGNALLING
Information
Patent Application
Controlling Circuit for Analog Measurement Module and Controlling M...
Publication number
20120163798
Publication date
Jun 28, 2012
Yang-Han Lee
G01 - MEASURING TESTING
Information
Patent Application
TESTING APPARATUS WITH HIGH EFFICIENCY AND HIGH ACCURACY
Publication number
20100271041
Publication date
Oct 28, 2010
Yung-Yu Wu
G01 - MEASURING TESTING
Information
Patent Application
LOGIC TESTER AND METHOD FOR SIMULTANEOUSLY MEASURING DELAY PERIODS...
Publication number
20100153800
Publication date
Jun 17, 2010
Yung-Yu Wu
G01 - MEASURING TESTING
Information
Patent Application
TESTING CIRCUIT BOARD
Publication number
20090108859
Publication date
Apr 30, 2009
Cheng-Yung TENG
G01 - MEASURING TESTING
Information
Patent Application
Circuit testing apparatus
Publication number
20080243409
Publication date
Oct 2, 2008
Princeton Technology Corporation
Cheng-Yung Teng
G01 - MEASURING TESTING