Hugo Augustinus Joseph Cramer

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection method and apparatus, lithographic apparatus, lithograph...
- Patent number 8,294,907
- Issue date Oct 23, 2012
- ASML Netherlands B.V.
- Hugo Augustinus Joseph Cramer
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and apparatus, lithographic apparatus, lithograph...
- Patent number 8,189,195
- Issue date May 29, 2012
- ASML Netherlands B.V.
- Arie Jeffrey Den Boef
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection method and apparatus, lithographic apparatus, lithograph...
- Patent number 7,916,284
- Issue date Mar 29, 2011
- ASML Netherlands B.V.
- Mircea Dusa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection method and apparatus, lithographic apparatus, lithograph...
- Patent number 7,916,927
- Issue date Mar 29, 2011
- ASML Netherlands B.V.
- Hugo Augustinus Joseph Cramer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection method and apparatus, lithographic apparatus, lithograph...
- Patent number 7,738,103
- Issue date Jun 15, 2010
- ASML Netherlands B.V.
- Antione Gaston Marie Kiers
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming a substrate for use in calibrating a metrology to...
- Patent number 7,605,907
- Issue date Oct 20, 2009
- ASML Netherlands B.V.
- Hugo Augustinus Joseph Cramer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection method and apparatus, lithographic apparatus, lithograph...
- Patent number 7,460,237
- Issue date Dec 2, 2008
- ASML Netherlands B.V.
- Hugo Augustinus Joseph Cramer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device inspection method and apparatus using an asymmetric marker
- Patent number 7,112,813
- Issue date Sep 26, 2006
- ASML Netherlands B.V.
- Arie Jeffrey Den Boef
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Measuring a Structure on a Substrate, Comp...
- Publication number 20120123748
- Publication date May 17, 2012
- ASML NETHERLANDS B.V.
- Maria Johanna Hendrika Aben
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection Method for Lithography
- Publication number 20120044472
- Publication date Feb 23, 2012
- ASML NETHERLANDS B.V.
- Arie Jeffrey Den Boef
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Scatterometry Method and Measurement System for Lithography
- Publication number 20110304851
- Publication date Dec 15, 2011
- ASML NETHERLANDS B.V.
- Willem Marie Julia Marcel Coene
- G01 - MEASURING TESTING
Information Patent Application
Calibration Method, Inspection Method and Apparatus, Lithographic A...
- Publication number 20110292365
- Publication date Dec 1, 2011
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph Cramer
- G01 - MEASURING TESTING
Information Patent Application
Lithographic Focus and Dose Measurement Using A 2-D Target
- Publication number 20110249244
- Publication date Oct 13, 2011
- ASML NETHERLANDS B.V.
- Christian Marinus Leewis
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection Method and Apparatus, Lithographic Apparatus, Lithograph...
- Publication number 20110249247
- Publication date Oct 13, 2011
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph Cramer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection Apparatus and Associated Method and Monitoring and Contr...
- Publication number 20110231167
- Publication date Sep 22, 2011
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph CRAMER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method, Inspection Apparatus and Substrate for Determining an Appro...
- Publication number 20110085176
- Publication date Apr 14, 2011
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph Cramer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods and Scatterometers, Lithographic Systems, and Lithographic...
- Publication number 20110027704
- Publication date Feb 3, 2011
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph Cramer
- G01 - MEASURING TESTING
Information Patent Application
Method of Assessing a Model of a Substrate, an Inspection Apparatus...
- Publication number 20110026032
- Publication date Feb 3, 2011
- ASML Netherland B.V.
- Arie Jeffrey Den Boef
- G01 - MEASURING TESTING
Information Patent Application
Inspection Apparatus, Lithographic Apparatus, Lithographic Processi...
- Publication number 20100201963
- Publication date Aug 12, 2010
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph Cramer
- G01 - MEASURING TESTING
Information Patent Application
Inspection Method and Apparatus, Lithographic Apparatus, Lithograph...
- Publication number 20090135424
- Publication date May 28, 2009
- ASML NETHERLANDS B.V.
- Antoine Gaston Marie Kiers
- G01 - MEASURING TESTING
Information Patent Application
Method of Optimizing a Model, a Method of Measuring a Property, A D...
- Publication number 20090094005
- Publication date Apr 9, 2009
- ASML NETHERLANDS B.V.
- Arie Jeffrey DEN BOEF
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection method and apparatus, lithographic apparatus, lithograph...
- Publication number 20080279442
- Publication date Nov 13, 2008
- ASML NETHERLANDS B.V.
- Arie Jeffrey Den Boef
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of forming a substrate for use in calibrating a metrology to...
- Publication number 20080239277
- Publication date Oct 2, 2008
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph Cramer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection method and apparatus,lithographic apparatus, lithographi...
- Publication number 20080170780
- Publication date Jul 17, 2008
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph Cramer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection method and apparatus, lithographic apparatus, lithograph...
- Publication number 20080018874
- Publication date Jan 24, 2008
- ASML NETHERLANDS B.V.
- Mircea Dusa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of depositing a metal layer onto a substrate and a method fo...
- Publication number 20070093044
- Publication date Apr 26, 2007
- ASML NETHERLANDS B.V.
- Bartolomeus Petrus Rijpers
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Hugo Augustinus Joseph Cramer

Person

Patents Grantslast 30 patents

Inspection method and apparatus, lithographic apparatus, lithograph...

Inspection method and apparatus, lithographic apparatus, lithograph...

Inspection method and apparatus, lithographic apparatus, lithograph...

Inspection method and apparatus, lithographic apparatus, lithograph...

Inspection method and apparatus, lithographic apparatus, lithograph...

Method of forming a substrate for use in calibrating a metrology to...

Inspection method and apparatus, lithographic apparatus, lithograph...

Device inspection method and apparatus using an asymmetric marker

Patents Applicationslast 30 patents

Method and Apparatus for Measuring a Structure on a Substrate, Comp...

Inspection Method for Lithography

Scatterometry Method and Measurement System for Lithography

Calibration Method, Inspection Method and Apparatus, Lithographic A...

Lithographic Focus and Dose Measurement Using A 2-D Target

Inspection Method and Apparatus, Lithographic Apparatus, Lithograph...

Inspection Apparatus and Associated Method and Monitoring and Contr...

Method, Inspection Apparatus and Substrate for Determining an Appro...

Methods and Scatterometers, Lithographic Systems, and Lithographic...

Method of Assessing a Model of a Substrate, an Inspection Apparatus...

Inspection Apparatus, Lithographic Apparatus, Lithographic Processi...

Inspection Method and Apparatus, Lithographic Apparatus, Lithograph...

Method of Optimizing a Model, a Method of Measuring a Property, A D...

Inspection method and apparatus, lithographic apparatus, lithograph...

Method of forming a substrate for use in calibrating a metrology to...

Inspection method and apparatus,lithographic apparatus, lithographi...

Inspection method and apparatus, lithographic apparatus, lithograph...

Method of depositing a metal layer onto a substrate and a method fo...