Hugo Bender

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Edegem, BE

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Patents Grantslast 30 patents

Information Patent Grant
Method and tip substrate for scanning probe microscopy
- Patent number 11,112,427
- Issue date Sep 7, 2021
- Imec VZW
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for combined stem and EDS tomography
- Patent number 10,890,545
- Issue date Jan 12, 2021
- Imec VZW
- Hugo Bender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical semiconductor device and method for making the device
- Patent number 10,014,437
- Issue date Jul 3, 2018
- Imec VZW
- Hugo Bender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical semiconductor device and method for making the device
- Patent number 9,634,185
- Issue date Apr 25, 2017
- Imec VZW
- Hugo Bender
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND TIP SUBSTRATE FOR SCANNING PROBE MICROSCOPY
- Publication number 20210116476
- Publication date Apr 22, 2021
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR COMBINED STEM AND EDS TOMOGRAPHY
- Publication number 20190323977
- Publication date Oct 24, 2019
- IMEC vzw
- Hugo Bender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL SEMICONDUCTOR DEVICE AND METHOD FOR MAKING THE DEVICE
- Publication number 20170179337
- Publication date Jun 22, 2017
- IMEC vzw
- Hugo Bender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL SEMICONDUCTOR DEVICE AND METHOD FOR MAKING THE DEVICE
- Publication number 20160284929
- Publication date Sep 29, 2016
- IMEC vzw
- Hugo Bender
- H01 - BASIC ELECTRIC ELEMENTS