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Hugo Mauro V D C Cavalcanti
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Austin, TX, US
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last 30 patents
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Patent Grant
Integrated circuit with continuous testing of repetitive functional...
Patent number
7,676,715
Issue date
Mar 9, 2010
FREESCALE SEMICONDUCTOR, INC.
Gary L. Miller
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
INTEGRATED CIRCUIT WITH CONTINUOUS TESTING OF REPETITIVE FUNCTIONAL...
Publication number
20080301511
Publication date
Dec 4, 2008
FREESCALE SEMICONDUCTOR, INC.
Gary L. Miller
G01 - MEASURING TESTING