Hui-Pin YANG

Person

CHU-PEI CITY, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Vertical probe head
- Patent number 11,774,468
- Issue date Oct 3, 2023
- MPI Corporation
- Chin-Tien Yang
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for high frequency signal test and medium or low frequen...
- Patent number 11,346,860
- Issue date May 31, 2022
- MPI Corporation
- Chin-Tien Yang
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for high frequency signal test and medium or low frequen...
- Patent number 11,150,269
- Issue date Oct 19, 2021
- MPI Corporation
- Hui-Pin Yang
- G01 - MEASURING TESTING
Information Patent Grant
High frequency probe card for probing photoelectric device
- Patent number 9,535,093
- Issue date Jan 3, 2017
- MPI Corporation
- Chia-Tai Chang
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing space transformer for probe card
- Patent number 9,442,135
- Issue date Sep 13, 2016
- MPI Corporation
- Kuan-Chun Chou
- G01 - MEASURING TESTING
Information Patent Grant
Probe holding structure and optical inspection device equipped with...
- Patent number 9,244,018
- Issue date Jan 26, 2016
- MPI Corporation
- Chia-Tai Chang
- G01 - MEASURING TESTING
Information Patent Grant
High frequency probe card
- Patent number 9,201,098
- Issue date Dec 1, 2015
- MPI Corporation
- Chia-Tai Chang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE SYSTEM FOR TESTING DEVICE UNDER TEST INTEGRATED IN SEMICONDUC...
- Publication number 20240402218
- Publication date Dec 5, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...
- Publication number 20240393368
- Publication date Nov 28, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...
- Publication number 20240393367
- Publication date Nov 28, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE HEAD
- Publication number 20230007997
- Publication date Jan 12, 2023
- MPI Corporation
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR HIGH FREQUENCY SIGNAL TEST AND MEDIUM OR LOW FREQUEN...
- Publication number 20210048451
- Publication date Feb 18, 2021
- MPI Corporation
- Chin-Tien YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR HIGH FREQUENCY SIGNAL TEST AND MEDIUM OR LOW FREQUEN...
- Publication number 20210048452
- Publication date Feb 18, 2021
- MPI Corporation
- Hui-Pin YANG
- G01 - MEASURING TESTING
Information Patent Application
HIGH FREQUENCY PROBE CARD FOR PROBING PHOTOELECTRIC DEVICE
- Publication number 20150028911
- Publication date Jan 29, 2015
- MPI Corporation
- Chia-Tai CHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING SPACE TRANSFORMER FOR PROBE CARD
- Publication number 20140290053
- Publication date Oct 2, 2014
- MPI Corporation
- Kuan-Chun CHOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE HOLDING STRUCTURE AND OPTICAL INSPECTION DEVICE EQUIPPED WITH...
- Publication number 20140016123
- Publication date Jan 16, 2014
- Chia-Tai CHANG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION DEVICE
- Publication number 20140016124
- Publication date Jan 16, 2014
- Chia-Tai CHANG
- G02 - OPTICS
Information Patent Application
HIGH FREQUENCY PROBE CARD
- Publication number 20140015561
- Publication date Jan 16, 2014
- Chia-Tai CHANG
- G01 - MEASURING TESTING

Hui-Pin YANG

Person

Patents Grantslast 30 patents

Vertical probe head

Probe head for high frequency signal test and medium or low frequen...

Probe head for high frequency signal test and medium or low frequen...

High frequency probe card for probing photoelectric device

Method of manufacturing space transformer for probe card

Probe holding structure and optical inspection device equipped with...

High frequency probe card

Patents Applicationslast 30 patents

PROBE SYSTEM FOR TESTING DEVICE UNDER TEST INTEGRATED IN SEMICONDUC...

PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...

PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...

VERTICAL PROBE HEAD

PROBE HEAD FOR HIGH FREQUENCY SIGNAL TEST AND MEDIUM OR LOW FREQUEN...

PROBE HEAD FOR HIGH FREQUENCY SIGNAL TEST AND MEDIUM OR LOW FREQUEN...

HIGH FREQUENCY PROBE CARD FOR PROBING PHOTOELECTRIC DEVICE

METHOD OF MANUFACTURING SPACE TRANSFORMER FOR PROBE CARD

PROBE HOLDING STRUCTURE AND OPTICAL INSPECTION DEVICE EQUIPPED WITH...

OPTICAL INSPECTION DEVICE

HIGH FREQUENCY PROBE CARD