Hui-Yun CHAO

Person

Zhubei City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method of test probe alignment control
- Patent number 10,161,965
- Issue date Dec 25, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods of automatically detecting failure patterns for...
- Patent number 9,165,843
- Issue date Oct 20, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jui-Long Chen
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
2D/3D analysis for abnormal tools and stages diagnosis
- Patent number 9,158,867
- Issue date Oct 13, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Hsien Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of test probe alignment control
- Patent number 9,000,798
- Issue date Apr 7, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G01 - MEASURING TESTING
Information Patent Grant
Auto device skew manufacturing
- Patent number 8,942,840
- Issue date Jan 27, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Systems and methods of automatically detecting failure patterns for...
- Patent number 8,938,698
- Issue date Jan 20, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jui-Long Chen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Systems and methods of automatically detecting failure patterns for...
- Patent number 8,627,251
- Issue date Jan 7, 2014
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jui-Long Chen
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
System and method for data mining and feature tracking for fab-wide...
- Patent number 8,406,912
- Issue date Mar 26, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Auto device skew manufacturing
- Patent number 8,391,999
- Issue date Mar 5, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Method of Test Probe Alignment Control
- Publication number 20150192616
- Publication date Jul 9, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS OF AUTOMATICALLY DETECTING FAILURE PATTERNS FOR...
- Publication number 20150125970
- Publication date May 7, 2015
- Taiwan Semiconductor Manufacturing Co., LTD
- Jui-Long CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS OF AUTOMATICALLY DETECTING FAILURE PATTERNS FOR...
- Publication number 20140106474
- Publication date Apr 17, 2014
- Taiwan Semiconductor Manufacturing Co., LTD
- Jui-Long CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
2D/3D Analysis for Abnormal Tools and Stages Diagnosis
- Publication number 20140100684
- Publication date Apr 10, 2014
- Taiwan Semiconductor Manufacturing Co. Ltd.
- Chun-Hsien Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF TEST PROBE ALIGNMENT CONTROL
- Publication number 20130335109
- Publication date Dec 19, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS OF AUTOMATICALLY DETECTING FAILURE PATTERNS FOR...
- Publication number 20130288403
- Publication date Oct 31, 2013
- Taiwan Semiconductor Manufacturing Co., LTD
- Jui-Long CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Auto Device Skew Manufacturing
- Publication number 20130131858
- Publication date May 23, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DATA MINING AND FEATURE TRACKING FOR FAB-WIDE...
- Publication number 20110320026
- Publication date Dec 29, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G05 - CONTROLLING REGULATING
Information Patent Application
Auto Device Skew Manufacturing
- Publication number 20110307088
- Publication date Dec 15, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G06 - COMPUTING CALCULATING COUNTING

Hui-Yun CHAO

Person

Patents Grantslast 30 patents

Method of test probe alignment control

Systems and methods of automatically detecting failure patterns for...

2D/3D analysis for abnormal tools and stages diagnosis

Method of test probe alignment control

Auto device skew manufacturing

Systems and methods of automatically detecting failure patterns for...

Systems and methods of automatically detecting failure patterns for...

System and method for data mining and feature tracking for fab-wide...

Auto device skew manufacturing

Patents Applicationslast 30 patents

Method of Test Probe Alignment Control

SYSTEMS AND METHODS OF AUTOMATICALLY DETECTING FAILURE PATTERNS FOR...

SYSTEMS AND METHODS OF AUTOMATICALLY DETECTING FAILURE PATTERNS FOR...

2D/3D Analysis for Abnormal Tools and Stages Diagnosis

METHOD OF TEST PROBE ALIGNMENT CONTROL

SYSTEMS AND METHODS OF AUTOMATICALLY DETECTING FAILURE PATTERNS FOR...

Auto Device Skew Manufacturing

SYSTEM AND METHOD FOR DATA MINING AND FEATURE TRACKING FOR FAB-WIDE...

Auto Device Skew Manufacturing