Huina XU

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope objective lens calibration using X-Y v...
- Patent number 10,790,114
- Issue date Sep 29, 2020
- KLA-Tencor Corporation
- Ichiro Honjo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated decision-based energy-dispersive x-ray methodology and ap...
- Patent number 9,696,268
- Issue date Jul 4, 2017
- KLA-Tencor Corporation
- Harsh Sinha
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Scanning Electron Microscope Objective Lens Calibration
- Publication number 20190004298
- Publication date Jan 3, 2019
- KLA-Tencor Corporation
- Ichiro Honjo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED DECISION-BASED ENERGY-DISPERSIVE X-RAY METHODOLOGY AND AP...
- Publication number 20160116425
- Publication date Apr 28, 2016
- KLA-Tencor Corporation
- Harsh SINHA
- G01 - MEASURING TESTING