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Huini DU
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Vernon Hills, IL, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus to determine energy correction arising from mu...
Patent number
10,768,318
Issue date
Sep 8, 2020
Canon Medical Systems Corporation
Yi Qiang
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for improving uniformity of performance in pos...
Patent number
9,140,805
Issue date
Sep 22, 2015
Kabushiki Kaisha Toshiba
Gin Chung Wang
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Reflector having adaptive reflectivity for radiation detection
Patent number
9,035,261
Issue date
May 19, 2015
Kabushiki Kaisha Toshiba
Gin-Chung Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method to improve light extraction from scintillators
Patent number
9,006,668
Issue date
Apr 14, 2015
Kabushiki Kaisha Toshiba
Jerry Wang
G01 - MEASURING TESTING
Information
Patent Grant
Determining relative timing offset in different electronic pathways...
Patent number
8,987,653
Issue date
Mar 24, 2015
Kabushiki Kaisha Toshiba
Huini Du
G01 - MEASURING TESTING
Information
Patent Grant
Determining relative timing offset in different electronic pathways...
Patent number
8,957,362
Issue date
Feb 17, 2015
Kabushiki Kaisha Toshiba
Huini Du
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for photosensor gain and scintillation crystal...
Patent number
8,859,951
Issue date
Oct 14, 2014
Kabushiki Kaisha Toshiba
Gin Chung Wang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Timing calibration for time-of-flight (TOF) PET using positron-emit...
Patent number
8,796,637
Issue date
Aug 5, 2014
Kabushiki Kaisha Toshiba
Kent C. Burr
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS TO DETERMINE ENERGY CORRECTION ARISING FROM MU...
Publication number
20200124750
Publication date
Apr 23, 2020
Canon Medical Systems Corporation
Yi QIANG
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
DETERMINING RELATIVE TIMING OFFSET IN DIFFERENT ELECTRONIC PATHWAYS...
Publication number
20150014519
Publication date
Jan 15, 2015
Kabushiki Kaisha Toshiba
Huini DU
G01 - MEASURING TESTING
Information
Patent Application
Adaptive reflectivity for performance improvement on radiation dete...
Publication number
20140151562
Publication date
Jun 5, 2014
Gin-Chung WANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR PHOTOSENSOR GAIN AND SCINTILLATION CRYSTAL...
Publication number
20140110573
Publication date
Apr 24, 2014
Gin Chung WANG
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR IMPROVING UNIFORMITY OF PERFORMANCE IN POS...
Publication number
20140110589
Publication date
Apr 24, 2014
Gin Chung WANG
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING RELATIVE TIMING OFFSET IN DIFFERENT ELECTRONIC PATHWAYS...
Publication number
20140110567
Publication date
Apr 24, 2014
Huini DU
G01 - MEASURING TESTING
Information
Patent Application
METHOD TO IMPROVE LIGHT EXTRACTION FROM SCINTILLATORS
Publication number
20140091234
Publication date
Apr 3, 2014
Jerry WANG
G01 - MEASURING TESTING