Huining Liu

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for temperature sensing in integrated circuits
- Patent number 7,455,450
- Issue date Nov 25, 2008
- Advanced Micro Devices, Inc.
- Huining Liu
- G01 - MEASURING TESTING
Information Patent Grant
Zoned thermal monitoring
- Patent number 7,180,380
- Issue date Feb 20, 2007
- Advanced Micro Devices, Inc.
- Michael D. Bienek
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for temperature sensing in integrated circuits
- Publication number 20070081575
- Publication date Apr 12, 2007
- Advanced Micro Devices, Inc.
- Huining Liu
- G01 - MEASURING TESTING
Information Patent Application
Zoned thermal monitoring
- Publication number 20060238267
- Publication date Oct 26, 2006
- Advanced Micro Devices, Inc.
- Michael D. Bienek
- G01 - MEASURING TESTING