Huishao HE

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Afterglow detection device and afterglow detection method
- Patent number 10,775,320
- Issue date Sep 15, 2020
- Nuctech Company Limited
- Shuwei Li
- G01 - MEASURING TESTING
Information Patent Grant
Detection apparatus and detection method
- Patent number 10,539,531
- Issue date Jan 21, 2020
- Nuctech Company Limited
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Ion migration tube and method of operating the same
- Patent number 10,535,509
- Issue date Jan 14, 2020
- Nuctech Company Limited
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Packaging structures for metallic bonding based opto-electronic dev...
- Patent number 10,510,683
- Issue date Dec 17, 2019
- Tsinghua University
- Wenjian Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray beam intensity monitoring device and X-ray inspection
- Patent number 10,466,372
- Issue date Nov 5, 2019
- Tsinghua University
- Kejun Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection apparatus and detection method
- Patent number 10,429,348
- Issue date Oct 1, 2019
- Nuctech Company Limited
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Darkroom type security inspection apparatus and method
- Patent number 10,408,804
- Issue date Sep 10, 2019
- Tsinghua University
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Darkroom type security inspection apparatus and method
- Patent number 10,281,431
- Issue date May 7, 2019
- Nuctech Company Limited
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Detection apparatus and detection method
- Patent number 10,281,432
- Issue date May 7, 2019
- Nuctech Company Limited
- Qingjun Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas chromatography-ion mobility spectrometry apparatus
- Patent number 10,234,436
- Issue date Mar 19, 2019
- Nuctech Company Limited
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Sample injection device and method for sample collection and sample...
- Patent number 10,215,666
- Issue date Feb 26, 2019
- Nuctech Company Limited
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Sampling device and gas curtain guide
- Patent number 10,151,671
- Issue date Dec 11, 2018
- Nuctech Company Limited
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Sample introduction device
- Patent number 10,032,616
- Issue date Jul 24, 2018
- Nuctech Company Limited
- Qingjun Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Safety inspection detector and goods safety inspection system compr...
- Patent number 9,983,321
- Issue date May 29, 2018
- Nuctech Company Limited
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Gas analyzing apparatus and sampling device
- Patent number 9,772,306
- Issue date Sep 26, 2017
- Nuctech Company Limited
- Qingjun Zhang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AFTERGLOW DETECTION DEVICE AND AFTERGLOW DETECTION METHOD
- Publication number 20190346380
- Publication date Nov 14, 2019
- Nuctech Company Limited
- Shuwei LI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION APPARATUS AND DETECTION METHOD
- Publication number 20190234904
- Publication date Aug 1, 2019
- Nuctech Company Limited
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Application
DETECTION APPARATUS AND DETECTION METHOD
- Publication number 20190234905
- Publication date Aug 1, 2019
- Nuctech Company Limited
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Application
ION MIGRATION TUBE AND METHOD OF OPERATING THE SAME
- Publication number 20180190482
- Publication date Jul 5, 2018
- Nuctech Company Limited
- Qingjun Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS CHROMATOGRAPHY-ION MOBILITY SPECTROMETRY APPARATUS
- Publication number 20180164262
- Publication date Jun 14, 2018
- Nuctech Company Limited
- Qingjun ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PACKAGING STRUCTURES FOR METALLIC BONDING BASED OPTO-ELECTRONIC DEV...
- Publication number 20180158785
- Publication date Jun 7, 2018
- TSINGHUA UNIVERSITY
- Wenjian ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE INJECTION DEVICE AND METHOD FOR SAMPLE COLLECTION AND SAMPLE...
- Publication number 20170176299
- Publication date Jun 22, 2017
- Nuctech Company Limited
- Qingjun ZHANG
- G01 - MEASURING TESTING
Information Patent Application
DARKROOM TYPE SECURITY INSPECTION APPARATUS AND METHOD
- Publication number 20170138914
- Publication date May 18, 2017
- TSINGHUA UNIVERSITY
- Qingjun ZHANG
- G01 - MEASURING TESTING
Information Patent Application
DARKROOM TYPE SECURITY INSPECTION APPARATUS AND METHOD
- Publication number 20170138902
- Publication date May 18, 2017
- Nuctech Company Limited
- Qingjun ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SAFETY INSPECTION DETECTOR AND GOODS SAFETY INSPECTION SYSTEM
- Publication number 20170068003
- Publication date Mar 9, 2017
- Nuctech Company Limited
- Qingjun ZHANG
- G01 - MEASURING TESTING
Information Patent Application
DETECTION APPARATUS AND DETECTION METHOD
- Publication number 20170016856
- Publication date Jan 19, 2017
- Nuctech Company Limited
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Application
SAMPLING DEVICE AND GAS CURTAIN GUIDE
- Publication number 20160356679
- Publication date Dec 8, 2016
- Nuctech Company Limited
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYZING APPARATUS AND SAMPLING DEVICE
- Publication number 20160341695
- Publication date Nov 24, 2016
- Nuctech Company Limited
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BEAM INTENSITY MONITORING DEVICE AND X-RAY INSPECTION SYSTEM
- Publication number 20160187502
- Publication date Jun 30, 2016
- TSINGHUA UNIVERSITY
- Kejun KANG
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE INTRODUCTION DEVICE
- Publication number 20160189945
- Publication date Jun 30, 2016
- Nuctech Company Limited
- Qingjun ZHANG
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Afterglow detection device and afterglow detection method

Detection apparatus and detection method

Ion migration tube and method of operating the same

Packaging structures for metallic bonding based opto-electronic dev...

X-ray beam intensity monitoring device and X-ray inspection

Detection apparatus and detection method

Darkroom type security inspection apparatus and method

Darkroom type security inspection apparatus and method

Detection apparatus and detection method

Gas chromatography-ion mobility spectrometry apparatus

Sample injection device and method for sample collection and sample...

Sampling device and gas curtain guide

Sample introduction device

Safety inspection detector and goods safety inspection system compr...

Gas analyzing apparatus and sampling device

Patents Applicationslast 30 patents

AFTERGLOW DETECTION DEVICE AND AFTERGLOW DETECTION METHOD

DETECTION APPARATUS AND DETECTION METHOD

DETECTION APPARATUS AND DETECTION METHOD

ION MIGRATION TUBE AND METHOD OF OPERATING THE SAME

GAS CHROMATOGRAPHY-ION MOBILITY SPECTROMETRY APPARATUS

PACKAGING STRUCTURES FOR METALLIC BONDING BASED OPTO-ELECTRONIC DEV...

SAMPLE INJECTION DEVICE AND METHOD FOR SAMPLE COLLECTION AND SAMPLE...

DARKROOM TYPE SECURITY INSPECTION APPARATUS AND METHOD

DARKROOM TYPE SECURITY INSPECTION APPARATUS AND METHOD

SAFETY INSPECTION DETECTOR AND GOODS SAFETY INSPECTION SYSTEM

DETECTION APPARATUS AND DETECTION METHOD

SAMPLING DEVICE AND GAS CURTAIN GUIDE

GAS ANALYZING APPARATUS AND SAMPLING DEVICE

X-RAY BEAM INTENSITY MONITORING DEVICE AND X-RAY INSPECTION SYSTEM

SAMPLE INTRODUCTION DEVICE