Huiwen Liu

Person

Eden Prairie, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Atomic force microscopy of scanning and image processing
- Patent number 10,126,326
- Issue date Nov 13, 2018
- Seagate Technology LLC
- Lin Zhou
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Accuracy and precision in raman spectroscopy
- Patent number 9,689,743
- Issue date Jun 27, 2017
- Seagate Technology LLC
- Huiwen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Semi-auto scanning probe microscopy scanning
- Patent number 9,586,817
- Issue date Mar 7, 2017
- Seagate Technology LLC
- Huiwen Liu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods and devices for correcting errors in atomic force microscopy
- Patent number 9,527,732
- Issue date Dec 27, 2016
- Seagate Technology LLC
- Huiwen Liu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy of scanning and image processing
- Patent number 9,150,415
- Issue date Oct 6, 2015
- Seagate Technology LLC
- Lin Zhou
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus used for determining friction between slider a...
- Patent number 8,869,590
- Issue date Oct 28, 2014
- Seagate Technology LLC
- Huiwen Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Variable pixel density imaging
- Patent number 8,525,112
- Issue date Sep 3, 2013
- Seagate Technology LLC
- Lin Zhou
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscopy employing correlation pattern recognition
- Patent number 8,371,155
- Issue date Feb 12, 2013
- Seagate Technology LLC
- Lin Zhou
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy true shape measurement method
- Patent number 8,296,860
- Issue date Oct 23, 2012
- Seagate Technology LLC
- Huiwen Liu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy scanning and image processing
- Patent number 7,406,860
- Issue date Aug 5, 2008
- Seagate Technology LLC
- Lin Zhou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ATOMIC FORCE MICROSCOPY OF SCANNING AND IMAGE PROCESSING
- Publication number 20160025772
- Publication date Jan 28, 2016
- Seagate Technology LLC
- Lin Zhou
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS USED FOR DETERMINING FRICTION BETWEEN SLIDER A...
- Publication number 20140133053
- Publication date May 15, 2014
- SEAGATE TECHNOLOGY LLC
- Huiwen Liu
- G11 - INFORMATION STORAGE
Information Patent Application
ACCURACY AND PRECISION IN RAMAN SPECTROSCOPY
- Publication number 20140028996
- Publication date Jan 30, 2014
- SEAGATE TECHNOLOGY LLC
- Huiwen Liu
- G01 - MEASURING TESTING
Information Patent Application
ADVANCED ATOMIC FORCE MICROSCOPY SCANNING FOR OBTAINING A TRUE SHAPE
- Publication number 20130081159
- Publication date Mar 28, 2013
- SEAGATE TECHNOLOGY LLC
- Huiwen Liu
- B82 - NANO-TECHNOLOGY
Information Patent Application
SEMI-AUTO SCANNING PROBE MICROSCOPY SCANNING
- Publication number 20130031680
- Publication date Jan 31, 2013
- SEAGATE TECHNOLOGY LLC
- Huiwen Liu
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHODS AND DEVICES FOR CORRECTING ERRORS IN ATOMIC FORCE MICROSCOPY
- Publication number 20120079635
- Publication date Mar 29, 2012
- SEAGATE TECHNOLOGY LLC
- Huiwen Liu
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE PIXEL DENSITY IMAGING
- Publication number 20120042422
- Publication date Feb 16, 2012
- Seagate Technology LLC
- Lin Zhou
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPY EMPLOYING CORRELATION PATTERN RECOGNITION
- Publication number 20110138505
- Publication date Jun 9, 2011
- Seagate Technology LLC
- Lin Zhou
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY TRUE SHAPE MEASUREMENT METHOD
- Publication number 20100235956
- Publication date Sep 16, 2010
- Seagate Technology LLC
- Huiwen Liu
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY OF SCANNING AND IMAGE PROCESSING
- Publication number 20080276696
- Publication date Nov 13, 2008
- Seagate Technology LLC
- Lin Zhou
- G01 - MEASURING TESTING
Information Patent Application
Atomic force microscopy scanning and image processing
- Publication number 20070251306
- Publication date Nov 1, 2007
- Seagate Technology LLC
- Lin Zhou
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Atomic force microscopy of scanning and image processing

Accuracy and precision in raman spectroscopy

Semi-auto scanning probe microscopy scanning

Methods and devices for correcting errors in atomic force microscopy

Atomic force microscopy of scanning and image processing

Method and apparatus used for determining friction between slider a...

Variable pixel density imaging

Scanning probe microscopy employing correlation pattern recognition

Atomic force microscopy true shape measurement method

Atomic force microscopy scanning and image processing

Patents Applicationslast 30 patents

ATOMIC FORCE MICROSCOPY OF SCANNING AND IMAGE PROCESSING

METHOD AND APPARATUS USED FOR DETERMINING FRICTION BETWEEN SLIDER A...

ACCURACY AND PRECISION IN RAMAN SPECTROSCOPY

ADVANCED ATOMIC FORCE MICROSCOPY SCANNING FOR OBTAINING A TRUE SHAPE

SEMI-AUTO SCANNING PROBE MICROSCOPY SCANNING

METHODS AND DEVICES FOR CORRECTING ERRORS IN ATOMIC FORCE MICROSCOPY

VARIABLE PIXEL DENSITY IMAGING

SCANNING PROBE MICROSCOPY EMPLOYING CORRELATION PATTERN RECOGNITION

ATOMIC FORCE MICROSCOPY TRUE SHAPE MEASUREMENT METHOD

ATOMIC FORCE MICROSCOPY OF SCANNING AND IMAGE PROCESSING

Atomic force microscopy scanning and image processing